Tc max
2.4 K
Tc ambient
—
arXiv year
2021
Papers
15
Tc exp.
2.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2302.01549, confirmed by 2 papers
Evidence (25 records from 15 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.0 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/pc8v-dlhq |
| 2.4 | — | thin_film | resistivity | s_pm | 2023 | T1 | 2302.01549 |
| 2.3 | — | thin_film | resistivity | s_pm | 2023 | T1 | 2302.01549 |
| 2.0 | — | thin_film | resistivity | — | 2025 | — | 2506.17056 |
| 2.0 | — | — | — | unknown | 2022 | — | 2203.05867 |
| 2.0 | — | thin_film | — | — | 2022 | T1 | 2201.00990 |
| 1.9 | — | — | resistivity | unknown | 2021 | T3 | 2111.05650 |
| 1.8 | — | thin_film | resistivity | — | 2022 | T1 | 2210.14591 |
| 1.8 | — | thin_film | resistivity | — | 2022 | T1 | 2210.14591 |
| 1.7 | — | thin_film | resistivity | s_pm | 2023 | T1 | 2302.01549 |
| 1.7 | — | thin_film | resistivity | s_pm | 2023 | T1 | 2302.01549 |
| 1.3 | — | thin_film | resistivity | s-wave | 2026 | T3 | 2602.20148 |
| 1.3 | — | thin_film | resistivity | — | 2022 | T1 | 2210.14591 |
| 1.2 | — | — | resistivity | — | 2025 | — | 2506.18894 |
| 1.0 | — | thin_film | resistivity | — | 2025 | — | 2502.13264 |
| 1.0 | — | — | resistivity | — | 2025 | — | 2506.18894 |
| 1.0 | — | thin_film | — | — | 2022 | T1 | 2201.00990 |
| 0.9 | — | — | resistivity | unknown | 2021 | T3 | 2111.05650 |
| 0.9 | — | — | resistivity | — | 2022 | T1 | 2204.09094 |
| 0.7 | — | — | resistivity | — | 2025 | T1 | 2512.18944 |
| 0.5 | — | — | resistivity | — | 2025 | — | 2506.18894 |
| 0.2 | — | — | resistivity | — | 2025 | — | 2506.18894 |
| — | — | thin_film | resistivity | — | 2023 | — | 2308.13180 |
| — | — | thin_film | resistivity | — | 2023 | T1 | 2304.14426 |
| — | — | thin_film | — | — | 2022 | T3 | 2201.02561 |
Superconducting parameters
- Gap structure
- full_gap
- Hc2
- 25.0 T (extrapolated to 0 K, in-plane)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- KTaO3
- Pressure type
- none
- Doping type
- electron