Tc max
4.0 K
Tc ambient
4.0 K
arXiv year
2011
Papers
2
Tc exp.
4.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevLett.106.237001, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.0 | — | polycrystal | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevLett.106.237001 |
| 4.0 | — | — | — | — | 2011 | T1 | 1103.0597 |
Structure
- Crystal structure
- ThCr2Si2-type
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —