Tc max
18.5 K
Tc ambient
18.5 K
arXiv year
2012
Papers
1
Tc exp.
18.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1208.3318
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 18.5 | — | thin_film | resistivity | — | 2012 | T1 | 1208.3318 |
Structure
- Phase
- cuprate_214
- Lattice a (Å)
- 3.760
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- CDW
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrLaAlO4
- Pressure type
- none
- Doping type
- hole
- Doping level
- 0.060