Tc max
3.5 K
Tc ambient
—
arXiv year
1990
Papers
2
Tc exp.
3.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.84.155
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.5 | — | thin_film | resistivity | d-wave | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.155 |
| — | — | polycrystal | susceptibility | — | 1990 | T1 | DOI: 10.1103/PhysRevB.42.240 |
Structure
- Phase
- cuprate_214
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- LaSrAlO4
- Doping level
- 0.150