Tc max
25.1 K
Tc ambient
19.0 K
arXiv year
2004
Papers
4
Tc exp.
25.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.97.155157, confirmed by 2 papers
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.1 | — | thin_film | resistivity | unknown | 2018 | T1 | DOI: 10.1103/PhysRevB.97.155157 |
| 19.0 | ambient | thin_film | resistivity | d-wave | 2020 | T1 | 2012.03183 |
| — | — | thin_film | — | — | 2016 | T1 | 1602.06669 |
| — | — | thin_film | ARPES | — | 2004 | T3 | cond-mat/0401119 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping level
- 0.100