Tc max
32.0 K
Tc ambient
29.0 K
arXiv year
2002
Papers
30
Tc exp.
32.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0805.0978, confirmed by 2 papers
Evidence (46 records from 30 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 32.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.0978 |
| 32.0 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.060505 |
| 30.0 | — |
Structure
- Crystal structure
- c-axis oriented
- Space group
- I4/mmm (#139)
- Lattice a (Å)
- 4.010
- Lattice c (Å)
- 12.380
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- Hc2
- 9.0 T (optimally-doped)
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- AFM
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.100