Tc max
32.0 K
Tc ambient
29.0 K
arXiv year
2002
Papers
30
Tc exp.
32.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0805.0978, confirmed by 2 papers
Evidence (46 records from 30 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 32.0 | — | thin_film | resistivity | — | 2008 | T1 | 0805.0978 |
| 32.0 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.060505 |
| 30.0 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.224503 |
| 29.0 | — | thin_film | resistivity | — | 2010 | T1 | 1005.1235 |
| 29.0 | — | thin_film | resistivity | d-wave | 2008 | T1 | DOI: 10.1103/PhysRevLett.100.227001 |
| 29.0 | — | thin_film | resistivity | d-wave | 2005 | T1 | DOI: 10.1103/PhysRevB.71.104504 |
| 29.0 | — | thin_film | resistivity | d-wave | 2003 | T1 | DOI: 10.1103/PhysRevLett.90.057004 |
| 28.5 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.104512 |
| 28.0 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.174521 |
| 27.6 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.104512 |
| 27.0 | — | thin_film | resistivity | — | 2010 | T1 | 1005.1235 |
| 27.0 | — | thin_film | resistivity | d-wave | 2002 | T1 | DOI: 10.1103/PhysRevB.66.014531 |
| 26.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.174521 |
| 26.0 | ambient | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.014522 |
| 26.0 | — | — | — | — | 2018 | T1 | 1801.08257 |
| 25.6 | — | thin_film | resistivity | — | 2021 | T1 | 2101.01929 |
| 25.6 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.014517 |
| 25.3 | — | thin_film | resistivity | — | 2021 | T1 | 2101.01929 |
| 25.3 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.014517 |
| 25.0 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.115125 |
| 25.0 | — | thin_film | resistivity | — | 2009 | T1 | 0906.2974 |
| 25.0 | — | thin_film | resistivity | d-wave | 2002 | T1 | DOI: 10.1103/PhysRevB.66.014531 |
| 24.1 | — | thin_film | resistivity | — | 2021 | T1 | 2101.01929 |
| 24.1 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.014517 |
| 24.0 | — | — | — | — | 2022 | T1 | 2211.06961 |
| 24.0 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.83.060511 |
| 23.1 | — | thin_film | resistivity | — | 2021 | T1 | 2101.01929 |
| 23.1 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.014517 |
| 22.0 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.115125 |
| 21.0 | — | thin_film | resistivity | d-wave | 2021 | T1 | DOI: 10.1103/PhysRevB.104.064501 |
| 21.0 | ambient | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.014522 |
| 19.0 | — | thin_film | resistivity | d-wave | 2021 | T1 | DOI: 10.1103/PhysRevB.104.064501 |
| 15.0 | ambient | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.014522 |
| 5.0 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.224503 |
| — | — | thin_film | resistivity | — | 2025 | — | 2502.13612 |
| — | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.L220504 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2101.01929 |
| — | — | — | ARPES | — | 2021 | — | 2106.05551 |
| — | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.L020501 |
| — | — | thin_film | ARPES | — | 2021 | T1 | DOI: 10.1103/PhysRevB.104.155125 |
| — | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.125102 |
| — | — | — | — | — | 2018 | T3 | 1810.06511 |
| — | — | — | resistivity | — | 2014 | — | 1412.2775 |
| — | — | — | resistivity | — | 2011 | T1 | 1108.0940 |
| — | ambient | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.174515 |
| — | — | thin_film | susceptibility | — | 2003 | T1 | cond-mat/0301174 |
Structure
- Crystal structure
- c-axis oriented
- Space group
- I4/mmm (#139)
- Lattice a (Å)
- 4.010
- Lattice c (Å)
- 12.380
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- Hc2
- 9.0 T (optimally-doped)
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- AFM
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron
- Doping level
- 0.100