Tc max
25.0 K
Tc ambient
25.0 K
arXiv year
2003
Papers
3
Tc exp.
25.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:cond-mat/0311380, confirmed by 3 papers
Evidence (5 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.0 | — | — | resistivity | — | 2004 | T1 | cond-mat/0401120 |
| 25.0 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0311380 |
| 21.0 | — | thin_film | — | — | 2005 | T1 | cond-mat/0501575 |
| 21.0 | — | — | resistivity | — | 2004 | T1 | cond-mat/0401120 |
| 21.0 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0311380 |
Structure
- Phase
- cuprate_214
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Doping type
- isovalent