Tc max
45.0 K
Tc ambient
45.0 K
arXiv year
2024
Papers
4
Tc exp.
45.0 K
Tc theo.
—
Evidence
mixed
Tc max measured at ambient, thin_film, resistivity, arXiv:2412.16622
Evidence (6 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 45.0 | ambient | thin_film | resistivity | — | 2024 | T1 | 2412.16622 |
| 9.0 | ambient | thin_film | resistivity | — | 2024 | T1 | 2412.16622 |
| 8.5 | ambient |
Structure
- Crystal structure
- tetragonal
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrLaAlO4
- Doping level
- 0.050