Tc max
30.0 K
Tc ambient
—
arXiv year
2003
Papers
2
Tc exp.
30.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.69.020504, confirmed by 2 papers
Evidence (4 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 30.0 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.020504 |
| 30.0 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312428 |
| 5.0 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- LaAlO3