Tc max
82.5 K
Tc ambient
48.0 K
arXiv year
2023
Papers
6
Tc exp.
82.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at P=20 GPa, polycrystal, resistivity, arXiv:2407.05681, confirmed by 4 papers
Evidence (16 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 82.5 | 20.0 | polycrystal | resistivity | — | 2024 | T1 | 2407.05681 |
| 78.2 | 15.0 | — | resistivity | — | 2023 | — | 2311.08212 |
| 75.0 | 20.0 | polycrystal | susceptibility | — | 2024 | T1 | 2407.05681 |
| 60.0 | 20.0 | polycrystal | resistivity | — | 2024 | T1 | 2407.05681 |
| 48.0 | ambient | thin_film | resistivity | — | 2025 | T1 | 2501.08022 |
| 45.0 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 42.0 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 40.0 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 40.0 | 15.0 | — | resistivity | — | 2023 | — | 2311.08212 |
| 30.0 | ambient | thin_film | resistivity | — | 2025 | T1 | 2501.08022 |
| 19.5 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 15.5 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 10.0 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| 6.0 | ambient | thin_film | resistivity | — | 2026 | T2 | 2604.07807 |
| — | — | thin_film | resistivity | — | 2025 | T1 | 2505.19011 |
| — | — | polycrystal | — | — | 2025 | T1 | 2508.03414 |
Structure
- Crystal structure
- tetragonal I4/mmm
- Space group
- I4/mmm
- Phase
- bilayer
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- SLAO(001)