Tc max
2.2 K
Tc ambient
—
arXiv year
2021
Papers
9
Tc exp.
2.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2303.01811, confirmed by 3 papers
Overlayer
ktao3
Substrate
laalo3
Evidence (16 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.2 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/wt7x-3wpp |
| 2.2 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/nshl-7b3z |
| 2.2 | — | thin_film | resistivity | — | 2023 | T3 | 2303.01811 |
| 2.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/1848-9r5d |
| 2.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/wt7x-3wpp |
| 1.9 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevX.15.021018 |
| 1.8 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/1848-9r5d |
| 1.8 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/nshl-7b3z |
| 1.3 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevX.15.011006 |
| 1.1 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.127.086804 |
| 1.1 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevX.15.011006 |
| 1.0 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.17.L061001 |
| 0.9 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.026802 |
| 0.8 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.17.L061001 |
| 0.8 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.026802 |
| 0.8 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.127.086804 |
Structure
- Crystal structure
- 111
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- KTaO3
- Doping level
- 0.006