Tc max
0.5 K
Tc ambient
—
arXiv year
2008
Papers
24
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.93.184504, confirmed by 2 papers
Overlayer
laalo3
Substrate
srtio3
Evidence (26 records from 24 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.7 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.144517 |
| 0.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.184504 |
| 0.4 | — | thin_film | resistivity | — | 2009 | T3 | 0906.5310 |
| 0.4 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.094518 |
| 0.4 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.184504 |
| 0.3 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.013311 |
| 0.3 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.104515 |
| 0.3 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.147001 |
| 0.3 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.140502 |
| 0.2 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.174502 |
| 0.2 | — | thin_film | susceptibility | s-wave | 2012 | T1 | DOI: 10.1103/PhysRevB.86.060503 |
| 0.2 | — | thin_film | resistivity | — | 2014 | T3 | 1409.5855 |
| 0.2 | — | thin_film | resistivity | — | 2017 | — | 1610.01380 |
| 0.2 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.024509 |
| 0.1 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.125117 |
| 0.1 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.144517 |
| 0.1 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.020504 |
| — | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.064512 |
| — | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.044802 |
| — | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.245113 |
| — | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.024504 |
| — | — | — | susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.064510 |
| — | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.134502 |
| — | — | thin_film | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevB.90.100506 |
| — | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevLett.107.056802 |
| — | — | thin_film | resistivity | — | 2008 | T3 | 0807.0585 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron