Tc max
0.5 K
Tc ambient
—
arXiv year
2008
Papers
25
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.93.184504, confirmed by 2 papers
Overlayer
laalo3
Substrate
srtio3
Evidence (27 records from 25 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.7 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.144517 |
| 0.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.184504 |
| 0.4 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- electron