Tc max
0.8 K
Tc ambient
0.8 K
arXiv year
2008
Papers
15
Tc max measured at arXiv:1311.1791, confirmed by 4 papers
Evidence (16 records from 15 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.8 | — | — | — | — | 2013 | — | 1311.1791 |
| 0.4 | — | thin_film | resistivity | — | 2009 | — | 0906.5310 |
| 0.2 | — | thin_film | resistivity | s-wave | 2014 | — | 1411.3103 |
| 0.1 | — | thin_film | resistivity | s-wave | 2014 | — | 1411.3103 |
| 0.1 | — | thin_film | resistivity | — | 2009 | — | 0902.2668 |
| — | — | thin_film | resistivity | unknown | 2017 | — | 1707.03029 |
| — | — | thin_film | resistivity | — | 2017 | — | 1704.01203 |
| — | — | thin_film | resistivity | — | 2017 | — | 1706.01717 |
| — | — | — | resistivity | — | 2015 | — | 1509.03449 |
| — | — | nanowires | resistivity | — | 2014 | — | 1410.6999 |
| — | — | thin_film | resistivity | — | 2013 | — | 1309.3612 |
| — | — | thin_film | resistivity | — | 2013 | — | 1306.5673 |
| — | — | — | resistivity | — | 2013 | — | 1306.1407 |
| — | — | — | susceptibility | — | 2011 | — | 1108.3150 |
| — | — | thin_film | resistivity | — | 2011 | — | 1110.2184 |
| — | — | thin_film | resistivity | — | 2008 | — | 0807.0585 |
Structure
- Crystal structure
- hexagonal symmetry at interface
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO_3
- Pressure type
- none
- Doping type
- electron