Tc max
40.0 K
Tc ambient
28.0 K
arXiv year
2008
Papers
27
Tc exp.
40.0 K
Tc theo.
0.8 K
Evidence
experimental
Tc max measured at ambient, polycrystal, resistivity, arXiv:1507.01750, confirmed by 2 papers
Evidence (37 records from 27 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 43.0 | 4.5 | polycrystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172502 |
| 40.0 | ambient | polycrystal | resistivity | — | 2015 | T1 | 1507.01750 |
| 30.0 | ambient | polycrystal | susceptibility | — | 2015 | T1 | 1507.01750 |
| 30.0 | — | thin_film | resistivity, infrared spectroscopy | s-wave | 2013 | T1 | 1304.6327 |
| 28.0 | ambient | polycrystal | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.235111 |
| 28.0 | — | — | NMR | — | 2010 | — | 1009.4273 |
| 28.0 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.077001 |
| 28.0 | — | thin_film | resistivity | — | 2009 | T1 | 0907.2271 |
| 27.0 | ambient | polycrystal | susceptibility | — | 2013 | T1 | 1303.0917 |
| 27.0 | 3.0 | polycrystal | susceptibility | — | 2013 | T1 | 1303.0917 |
| 27.0 | ambient | polycrystal | resistivity | unknown | 2009 | T1 | DOI: 10.1103/PhysRevB.79.184526 |
| 27.0 | — | polycrystal | — | — | 2009 | T1 | 0902.3441 |
| 26.0 | ambient | polycrystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172502 |
| 26.0 | — | — | resistivity, susceptibility, specific_heat | — | 2008 | T1 | 0806.3304 |
| 24.0 | ambient | polycrystal | muSR, susceptibility | s-wave | 2015 | T1 | DOI: 10.1103/PhysRevLett.114.247004 |
| 24.0 | 2.3 | polycrystal | muSR, susceptibility | s-wave | 2015 | T1 | DOI: 10.1103/PhysRevLett.114.247004 |
| 24.0 | ambient | polycrystal | muSR | s-wave | 2015 | — | 1502.02713 |
| 24.0 | 2.3 | polycrystal | muSR, susceptibility | s-wave | 2015 | — | 1502.02713 |
| 22.0 | — | — | susceptibility | — | 2013 | T1 | 1307.3138 |
| 20.0 | ambient | polycrystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.172502 |
| 19.0 | — | polycrystal | susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.81.024506 |
| 18.0 | 7.0 | polycrystal | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.235111 |
| 18.0 | — | — | susceptibility | — | 2013 | T1 | 1307.3138 |
| 18.0 | 3.0 | powder | susceptibility | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.094501 |
| 16.0 | — | — | susceptibility | — | 2013 | T1 | 1307.3138 |
| 11.0 | — | thin_film | resistivity | — | 2008 | T1 | 0808.1864 |
| 9.0 | — | — | susceptibility | — | 2013 | T1 | 1307.3138 |
| 5.0 | — | polycrystal | susceptibility, muSR | s_pm | 2010 | T1 | 1009.2062 |
| 0.8 | — | — | — | — | 2009 | — | 0901.3538 |
| — | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevLett.106.137001 |
| — | — | — | — | s_pm | 2009 | — | 0902.3691 |
| — | ambient | single_crystal | — | — | 2009 | — | 0909.3510 |
| — | — | — | — | d-wave | 2009 | T3 | 0911.1461 |
| — | — | — | — | s-wave | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.109902 |
| — | — | — | STM | — | 2008 | T1 | 0807.3149 |
| — | — | — | — | s_pm | 2008 | T1 | 0803.3325 |
| — | — | — | resistivity | — | 2008 | T1 | 0809.1133 |
Structure
- Lattice a (Å)
- 4.030
- Lattice c (Å)
- 8.740
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 77.0 T (0 K)
- λ_eph (e–ph coupling)
- 0.21
- ω_log
- 206 K
Competing orders
- T_AFM
- 140.0 K
- ρ(T) exponent
- 1.00
Samples & pressure
- Sample form
- polycrystal
- Substrate
- LaAlO3
- Doping type
- electron
- Doping level
- 0.130