Tc max
0.4 K
Tc ambient
0.4 K
arXiv year
1986
Papers
1
Tc exp.
0.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, single_crystal, susceptibility, DOI: 10.1103/PhysRevB.34.4566
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.4 | ambient | single_crystal | susceptibility | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.4566 |
Structure
- Crystal structure
- ThCr2Si2-type
- Space group
- I4/mmm
- Lattice a (Å)
- 4.283
- Lattice c (Å)
- 9.880
Superconducting parameters
- Hc2
- 0.0 T (0 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- single_crystal
- Pressure type
- none