Tc max
42.0 K
Tc ambient
42.0 K
arXiv year
2014
Papers
12
Tc exp.
42.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, susceptibility, DOI: 10.1103/PhysRevLett.125.217002, confirmed by 3 papers
Evidence (16 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 42.4 | — | thin_film | resistivity, susceptibility | — | 2017 | — | 1706.07610 |
| 42.0 | — | thin_film | susceptibility, resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.217002 |
| 42.0 | — | thin_film |
Structure
- Crystal structure
- Tetragonal
- Space group
- P4/nmm O1 (#129)
- Lattice a (Å)
- 3.788
- Lattice c (Å)
- 9.271
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- T_SDW
- 127.0 K
Samples & pressure
- Substrate
- LaAlO3
- Doping level
- 0.200