Tc max
5.5 K
Tc ambient
5.5 K
arXiv year
1999
Papers
3
Tc exp.
5.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, DOI: 10.1103/PhysRevB.59.9590, confirmed by 2 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.5 | — | single_crystal | — | — | 1999 | T1 | DOI: 10.1103/PhysRevB.59.9590 |
| 4.3 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.104504 |
| 3.5 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.104504 |
| — | — | — | — | — | 2025 | — | 2505.07241 |
Structure
- Crystal structure
- P3-m1
- Space group
- P3-m1
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Al2O3
- Doping type
- hole