Tc max
43.2 K
Tc ambient
22.0 K
arXiv year
2015
Papers
13
Tc exp.
43.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevMaterials.9.L041001, confirmed by 2 papers
Evidence (17 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 43.4 | — | single_crystal | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.060501 |
| 43.2 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/PhysRevMaterials.9.L041001 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- T_AFM
- 125.0 K
Samples & pressure
- Sample form
- single_crystal
- Substrate
- LaAlO3