Tc max
13.4 K
Tc ambient
13.0 K
arXiv year
2004
Papers
21
Tc exp.
13.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at powder, susceptibility, arXiv:0810.4865, confirmed by 2 papers
Evidence (26 records from 21 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 13.7 | — | — | susceptibility | — | 2010 | T3 | 1009.5134 |
| 13.4 | — | powder | susceptibility | — | 2008 | T1 | 0810.4865 |
| 13.0 | — | thin_film | ARPES | — | 2026 | T1 | DOI: 10.1103/q3xq-6p5f |
| 13.0 | ambient | thin_film | resistivity, susceptibility | d-wave | 2021 | T1 | 2110.13397 |
| 12.5 | — | thin_film | resistivity, SQUID | s-wave | 2025 | — | 2505.09762 |
| 12.5 | — | polycrystal | resistivity | s-wave | 2006 | T1 | DOI: 10.1103/PhysRevB.73.184521 |
| 12.3 | — | polycrystal | resistivity | s-wave | 2006 | T1 | DOI: 10.1103/PhysRevB.73.184521 |
| 12.0 | ambient | thin_film | resistivity | d-wave | 2021 | T1 | 2110.13397 |
| 11.5 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.184509 |
| 11.5 | — | thin_film | resistivity | — | 2018 | T1 | 1812.11047 |
| 11.4 | — | polycrystal | specific_heat, resistivity | s-wave | 2004 | T1 | DOI: 10.1103/PhysRevB.70.054519 |
| 11.4 | — | — | specific_heat | s-wave | 2004 | T1 | cond-mat/0407695 |
| 11.3 | — | thin_film | resistivity | s-wave | 2025 | T1 | DOI: 10.1103/PhysRevB.112.045105 |
| 11.3 | — | thin_film | resistivity | s-wave | 2017 | T1 | DOI: 10.1103/PhysRevB.96.094501 |
| 11.3 | — | thin_film | resistivity | — | 2017 | T1 | 1705.05568 |
| 11.0 | — | thin_film | resistivity | s-wave | 2017 | T1 | DOI: 10.1103/PhysRevB.95.054510 |
| 11.0 | — | polycrystal | — | s-wave | 2006 | T1 | DOI: 10.1103/PhysRevB.73.184521 |
| 10.8 | — | thin_film | resistivity, susceptibility | — | 2007 | T1 | 0707.0522 |
| — | — | — | — | s-wave | 2026 | T2 | 2601.18472 |
| — | — | thin_film | STM | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.224511 |
| — | — | single_crystal | STM | — | 2023 | T1 | 2307.11970 |
| — | — | thin_film | resistivity | — | 2018 | T1 | 1812.11047 |
| — | — | — | — | — | 2017 | T1 | 1705.05568 |
| — | — | thin_film | resistivity | — | 2016 | T1 | 1608.06683 |
| — | — | thin_film | STM | — | 2016 | T1 | 1605.02327 |
| — | — | thin_film | resistivity | — | 2014 | T1 | 1408.3894 |
Structure
- Crystal structure
- spinel
- Space group
- Fd3m
- Lattice a (Å)
- 8.370
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 26.0 T (low temperatures, isotropic, oxygen-rich sample)
- λ_eph (e–ph coupling)
- 0.65
Competing orders
- ρ(T) exponent
- 1.99
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgAl2O4
- Doping type
- none