Tc max
3.8 K
Tc ambient
3.5 K
arXiv year
1986
Papers
4
Tc exp.
3.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, polycrystal, resistivity, DOI: 10.1103/PhysRevB.33.5062, confirmed by 3 papers
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.8 | ambient | polycrystal | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.33.5062 |
| 3.5 | ambient | polycrystal | specific_heat | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.6659 |
| 3.4 | ambient | polycrystal | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.7676 |
| — | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.4673 |
Structure
- Crystal structure
- Sc5Co4Si10-type
- Space group
- P4/mbm
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.52
Competing orders
- T_CDW
- 155.0 K
Samples & pressure
- Sample form
- polycrystal
- Pressure type
- none