Tc max
2.1 K
Tc ambient
—
arXiv year
2021
Papers
3
Tc max measured at thin_film, resistivity, arXiv:2205.04458
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.1 | — | thin_film | resistivity | — | 2022 | — | 2205.04458 |
| 0.8 | — | thin_film | resistivity | — | 2022 | — | 2205.04458 |
| — | — | — | STM | unknown | 2021 | — | 2109.13944 |
| — | — | thin_film | specific_heat | — | 2021 | — | 2111.08735 |
Superconducting parameters
- Gap structure
- nodal
- Hc2
- 0.1 T (T=65 mK, ν=-2.48)
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- Mott_insulator
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiO_2/Si