MgB₂

mgb2 · AlB2-type structure

ambient SCdisputed

Tc max

39.0 K

Tc ambient

39.0 K

arXiv year

2001

Papers

786

Tc exp.

40.7 K

Tc theo.

45.1 K

Evidence

experimental

Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0703637, confirmed by 10 papers

Evidence (1008 records from 786 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
58.0	—	—	susceptibility	—	2007	T1	0707.3931
52.0	—	—	susceptibility	—	2007	T1	0707.3931
50.0	—	wire	susceptibility	—	2001	T1	cond-mat/0109114
48.8	—	—	—	s-wave	2007	T2	cond-mat/0703201
45.5	—	—	—	s-wave	2007	T2	cond-mat/0703201
45.1	—	—	—	—	2004	T2	cond-mat/0402473
45.0	—	—	susceptibility	—	2007	T1	0707.3931
45.0	—	—	—	—	2004	T2	cond-mat/0404447
44.6	—	—	—	—	2004	T2	cond-mat/0402473
43.7	—	—	—	—	2004	T2	cond-mat/0402473
43.0	—	—	—	—	2002	T2	cond-mat/0212417
41.8	—	thin_film	resistivity	unknown	2004	T1	DOI: 10.1103/PhysRevLett.93.147006
41.8	—	thin_film	resistivity	—	2003	T1	cond-mat/0304164
41.5	—	thin_film	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.012504
41.0	—	thin_film	resistivity	—	2006	—	cond-mat/0606606
41.0	—	thin_film	resistivity	s-wave	2008	T1	DOI: 10.1103/PhysRevB.77.100507
41.0	—	thin_film	resistivity	—	2007	T1	0709.1989
41.0	—	thin_film	resistivity	s-wave	2006	T1	cond-mat/0602340
40.7	ambient	thin_film	resistivity	—	2007	T1	cond-mat/0703637
40.5	—	thin_film	—	—	2007	T1	0709.1884
40.5	—	thin_film	resistivity	—	2005	T1	cond-mat/0510489
40.3	—	thin_film	resistivity	s-wave	2008	T1	DOI: 10.1103/PhysRevB.77.100507
40.3	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0102436
40.3	ambient	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0103521
40.2	—	thin_film	resistivity	—	2007	T1	0709.1989
40.2	—	thin_film	resistivity	—	2006	T1	cond-mat/0606564
40.2	ambient	—	—	s-wave	2004	T2	cond-mat/0411603
40.0	—	thin_film	resistivity	—	2007	T1	0704.0126
40.0	—	thin_film	resistivity	—	2017	T1	1707.07860
40.0	—	thin_film	resistivity	—	2008	T1	0802.3443
40.0	—	thin_film	resistivity	—	2008	T1	0801.0838
40.0	—	—	—	s-wave	2004	T2	cond-mat/0406496
40.0	—	—	—	—	2003	T2	cond-mat/0310284
40.0	—	—	—	—	2002	T1	DOI: 10.1103/PhysRevB.65.212505
40.0	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0103344
40.0	—	powder	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.64.180506
40.0	—	—	—	s-wave	2001	T1	DOI: 10.1103/PhysRevB.64.020501
40.0	—	—	—	—	2001	T1	cond-mat/0107164
40.0	3.0	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0102383
40.0	—	—	—	—	2001	T2	cond-mat/0102479
40.0	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0106577
40.0	—	—	—	s-wave	2001	T2	cond-mat/0102499
40.0	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0103032
40.0	—	—	—	—	2001	T3	cond-mat/0111262
39.9	—	—	—	—	2016	T1	DOI: 10.1103/PhysRevB.93.014502
39.9	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0102436
39.7	ambient	—	—	—	2014	T1	1412.4860
39.7	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0108153
39.6	—	thin_film	resistivity	—	2010	T1	1006.3169
39.6	—	thin_film	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.184516
39.6	ambient	polycrystal	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.132509
39.6	—	thin_film	resistivity, susceptibility	—	2001	T1	DOI: 10.1103/PhysRevLett.87.277001
39.6	—	thin_film	resistivity	—	2001	T2	cond-mat/0107349
39.5	ambient	polycrystal	susceptibility	—	2006	T1	cond-mat/0611473
39.5	—	polycrystal	resistivity, susceptibility	s-wave	2001	T3	cond-mat/0110421
39.5	—	polycrystal	resistivity	—	2001	T2	cond-mat/0105157
39.5	—	polycrystal	resistivity	—	2001	T1	cond-mat/0103079
39.5	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0103487
39.5	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0102421
39.4	—	thin_film	resistivity	—	2014	T1	DOI: 10.1103/PhysRevSTAB.17.012001
39.4	—	polycrystal	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.094517
39.4	—	polycrystal	—	s-wave	2006	T1	DOI: 10.1103/PhysRevB.73.024509
39.4	—	thin_film	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.012504
39.4	—	—	—	—	2005	T2	cond-mat/0502659
39.4	—	—	—	—	2004	T2	cond-mat/0402473
39.4	—	—	—	—	2004	T2	cond-mat/0403136
39.4	—	—	—	—	2003	T2	cond-mat/0310284
39.4	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.66.012518
39.4	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.66.012513
39.4	—	wire	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevB.64.180501
39.4	—	wire	susceptibility, resistivity	—	2001	T1	DOI: 10.1103/PhysRevLett.86.2423
39.4	—	wire	susceptibility	—	2001	T2	cond-mat/0102289
39.4	ambient	wire	susceptibility	s-wave	2001	T2	cond-mat/0103422
39.3	—	—	—	—	2021	T1	DOI: 10.1103/PhysRevB.104.134510
39.3	—	thin_film	resistivity	—	2005	T1	cond-mat/0510489
39.3	—	thin_film	—	—	2004	T1	cond-mat/0403665
39.3	—	polycrystal	resistivity, susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.137005
39.3	—	polycrystal	resistivity, susceptibility	s-wave	2001	T1	cond-mat/0105598
39.3	—	polycrystal	resistivity	s-wave	2001	T1	cond-mat/0104303
39.3	—	polycrystal	resistivity	—	2001	T3	cond-mat/0109211
39.3	ambient	—	—	s-wave	2002	T2	cond-mat/0203195
39.3	ambient	powder	susceptibility	s-wave	2001	T2	cond-mat/0103538
39.3	ambient	powder	susceptibility	—	2001	T2	cond-mat/0106057
39.3	ambient	powder	susceptibility	unknown	2001	T1	DOI: 10.1103/PhysRevB.64.092505
39.3	ambient	polycrystal	—	—	2001	T3	cond-mat/0110268
39.2	—	polycrystal	resistivity, susceptibility, ARPES	s-wave	2017	—	1703.00217
39.2	—	thin_film	resistivity	—	2014	T1	DOI: 10.1103/PhysRevSTAB.17.012001
39.2	—	—	—	—	2006	T1	cond-mat/0601112
39.2	—	thin_film	susceptibility	—	2006	T1	DOI: 10.1103/PhysRevB.73.094510
39.2	ambient	thin_film	resistivity	—	2004	T1	cond-mat/0406325
39.2	—	wire	resistivity	—	2004	T1	DOI: 10.1103/PhysRevLett.92.217003
39.2	—	polycrystal	resistivity, susceptibility	—	2003	T1	cond-mat/0312235
39.2	—	polycrystal	resistivity, susceptibility	—	2003	T1	DOI: 10.1103/PhysRevB.67.094504
39.2	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0302245
39.2	—	thin_film	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.65.184520
39.2	—	polycrystal	resistivity	—	2002	T1	cond-mat/0206518
39.2	—	powder	susceptibility	—	2002	T3	cond-mat/0201450
39.2	ambient	thin_film	resistivity	—	2002	T3	cond-mat/0202502
39.2	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0208300
39.2	—	powder	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevLett.86.5974
39.2	ambient	polycrystal	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.64.012514
39.2	—	powder	—	—	2001	T1	DOI: 10.1103/PhysRevLett.87.047002
39.2	ambient	thin_film	resistivity, susceptibility	—	2001	T2	cond-mat/0105024
39.2	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0103287
39.2	ambient	polycrystal	susceptibility	s-wave	2001	T1	cond-mat/0104303
39.1	—	powder	susceptibility	—	2005	T1	DOI: 10.1103/PhysRevLett.94.247001
39.1	—	powder	susceptibility	—	2005	T2	cond-mat/0501244
39.1	ambient	polycrystal	—	—	2002	T2	cond-mat/0209270
39.1	—	polycrystal	resistivity	—	2002	T2	cond-mat/0212385
39.1	ambient	powder	susceptibility	—	2001	T2	cond-mat/0106057
39.1	—	powder	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.180501
39.1	—	powder	susceptibility	s-wave	2001	T1	cond-mat/0109404
39.0	—	thin_film	resistivity	—	2011	—	1112.1911
39.0	—	polycrystal	resistivity	—	2017	T1	1703.10270
39.0	—	single_crystal	—	s-wave	2015	—	1504.06347
39.0	—	single_crystal	ARPES	s-wave	2015	T1	DOI: 10.1103/PhysRevB.91.140502
39.0	—	single_crystal	ARPES	s-wave	2015	T1	DOI: 10.1103/PhysRevB.91.214519
39.0	—	single_crystal	ARPES	s_++	2015	T1	1503.07069
39.0	—	thin_film	resistivity	—	2010	T1	1008.1797
39.0	—	wire	resistivity	—	2009	—	0906.2025
39.0	ambient	—	—	s-wave	2009	T1	DOI: 10.1103/PhysRevB.80.092505
39.0	ambient	polycrystal	—	s-wave	2009	T1	DOI: 10.1103/PhysRevB.79.094518
39.0	ambient	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.064516
39.0	—	—	susceptibility	—	2007	T1	0707.3931
39.0	—	polycrystal	resistivity	—	2007	T1	0709.0618
39.0	—	wire	resistivity	—	2007	T1	DOI: 10.1103/PhysRevB.75.144507
39.0	—	—	—	s-wave	2006	T1	DOI: 10.1103/PhysRevB.73.104520
39.0	—	—	susceptibility	—	2006	T2	cond-mat/0605425
39.0	ambient	polycrystal	resistivity	—	2006	T1	cond-mat/0611473
39.0	—	thin_film	susceptibility	—	2006	T1	DOI: 10.1103/PhysRevLett.97.077002
39.0	ambient	polycrystal	susceptibility	—	2006	T1	cond-mat/0605689
39.0	—	polycrystal	resistivity	—	2006	—	cond-mat/0604342
39.0	—	single_crystal	STM	—	2006	—	cond-mat/0604354
39.0	—	thin_film	susceptibility	—	2005	T1	DOI: 10.1103/PhysRevB.72.024541
39.0	—	thin_film	susceptibility	—	2005	T1	cond-mat/0504156
39.0	—	polycrystal	—	—	2004	T1	cond-mat/0409622
39.0	—	thin_film	resistivity	—	2004	T1	DOI: 10.1103/PhysRevB.69.132508
39.0	—	wire	resistivity	—	2004	T1	DOI: 10.1103/PhysRevB.70.064520
39.0	—	single_crystal	resistivity, susceptibility	—	2004	T1	cond-mat/0405060
39.0	—	wire	resistivity	—	2004	T2	cond-mat/0404096
39.0	—	polycrystal	susceptibility	—	2004	T1	cond-mat/0406398
39.0	—	polycrystal	resistivity	—	2004	T1	cond-mat/0406615
39.0	ambient	thin_film	resistivity, susceptibility	s-wave	2004	T1	cond-mat/0411116
39.0	—	thin_film	resistivity	—	2004	T1	cond-mat/0411404
39.0	—	single_crystal	susceptibility, specific_heat, resistivity	—	2003	T1	DOI: 10.1103/PhysRevB.67.012505
39.0	—	thin_film	—	—	2003	T1	DOI: 10.1103/PhysRevLett.91.267002
39.0	—	thin_film	—	—	2003	T1	DOI: 10.1103/PhysRevB.67.064513
39.0	—	thin_film	resistivity	—	2003	T1	DOI: 10.1103/PhysRevB.68.064516
39.0	—	thin_film	—	—	2003	T1	cond-mat/0304603
39.0	—	single_crystal	—	—	2003	T1	cond-mat/0304656
39.0	—	thin_film	resistivity	—	2003	T1	cond-mat/0305466
39.0	—	thin_film	resistivity, susceptibility	—	2003	T1	cond-mat/0309589
39.0	—	polycrystal	resistivity	—	2003	T1	cond-mat/0309654
39.0	—	single_crystal	resistivity	—	2003	T2	cond-mat/0312348
39.0	—	polycrystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.052505
39.0	—	—	—	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.020513
39.0	ambient	polycrystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.65.100518
39.0	—	polycrystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.052514
39.0	—	polycrystal	resistivity, susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.064513
39.0	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevLett.88.247002
39.0	—	polycrystal	susceptibility, resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.65.132517
39.0	ambient	polycrystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.172503
39.0	—	polycrystal	STM	s-wave	2002	T2	cond-mat/0203329
39.0	—	—	—	—	2002	T1	cond-mat/0203464
39.0	—	—	susceptibility	—	2002	T1	cond-mat/0204396
39.0	—	—	resistivity	—	2002	T1	cond-mat/0204510
39.0	—	thin_film	—	—	2002	T1	cond-mat/0205361
39.0	—	polycrystal	susceptibility	—	2002	T1	cond-mat/0206518
39.0	—	thin_film	resistivity	—	2002	T1	cond-mat/0208304
39.0	—	thin_film	—	—	2002	T1	cond-mat/0209226
39.0	—	polycrystal	STM	—	2002	T2	cond-mat/0209447
39.0	—	thin_film	—	—	2002	T2	cond-mat/0212404
39.0	—	thin_film	—	—	2002	T3	cond-mat/0201260
39.0	—	—	susceptibility	—	2002	T2	cond-mat/0203443
39.0	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0102167
39.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103179
39.0	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.127001
39.0	—	polycrystal	resistivity, susceptibility, specific_heat	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.167003
39.0	ambient	polycrystal	susceptibility	—	2001	T3	cond-mat/0111022
39.0	—	—	—	s-wave	2001	T3	cond-mat/0111183
39.0	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0105332
39.0	—	thin_film	—	—	2001	T1	cond-mat/0105612
39.0	—	polycrystal	susceptibility, STM	s-wave	2001	T1	DOI: 10.1103/PhysRevB.63.220508
39.0	—	thin_film	resistivity	—	2001	T1	DOI: 10.1103/PhysRevLett.87.087002
39.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0104230
39.0	—	polycrystal	susceptibility, STM	—	2001	T1	cond-mat/0104285
39.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0104555
39.0	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0105204
39.0	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0105212
39.0	—	polycrystal	resistivity	—	2001	T2	cond-mat/0105215
39.0	—	single_crystal	STM	s-wave	2001	T2	cond-mat/0105592
39.0	ambient	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0107092
39.0	—	powder	—	—	2001	T1	cond-mat/0107240
39.0	—	—	—	s-wave	2001	T2	cond-mat/0107478
39.0	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0102264
39.0	—	polycrystal	STM, susceptibility	s-wave	2001	T2	cond-mat/0102312
39.0	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0102334
39.0	—	thin_film	susceptibility	—	2001	T1	cond-mat/0103542
39.0	—	polycrystal	reflectivity, resistivity, susceptibility	—	2001	T1	cond-mat/0103164
39.0	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0104086
39.0	—	thin_film	resistivity	s-wave	2001	T3	cond-mat/0110006
39.0	—	thin_film	—	—	2001	T1	cond-mat/0104266
39.0	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0104354
39.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0105363
39.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0106146
39.0	—	polycrystal	—	—	2001	T1	cond-mat/0102410
39.0	ambient	polycrystal	—	—	2001	T2	cond-mat/0102507
39.0	—	polycrystal	susceptibility	unknown	2001	T1	cond-mat/0103369
39.0	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0104088
39.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0105327
39.0	—	—	—	unknown	2001	T3	cond-mat/0111182
39.0	ambient	—	STM	s-wave	2001	T3	cond-mat/0112144
38.9	—	polycrystal	susceptibility	s-wave	2003	T1	DOI: 10.1103/PhysRevB.67.064505
38.9	—	thin_film	susceptibility	—	2003	T1	cond-mat/0303337
38.9	—	polycrystal	resistivity	s-wave	2002	T1	cond-mat/0210175
38.9	ambient	polycrystal	resistivity	—	2001	T2	cond-mat/0104203
38.9	0.3	powder	susceptibility	s-wave	2001	T2	cond-mat/0103538
38.9	0.3	powder	susceptibility	unknown	2001	T1	DOI: 10.1103/PhysRevB.64.092505
38.8	ambient	single_crystal	susceptibility	—	2007	T1	0705.3775
38.8	—	—	—	s-wave	2010	T1	DOI: 10.1103/PhysRevB.82.224508
38.8	—	—	susceptibility	—	2014	T1	1406.2414
38.8	—	single_crystal	resistivity	s-wave	2012	T1	1208.1684
38.8	—	polycrystal	resistivity	s-wave	2007	T1	DOI: 10.1103/PhysRevB.75.184513
38.8	—	polycrystal	resistivity	—	2005	T1	cond-mat/0508137
38.8	—	polycrystal	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.72.174518
38.8	—	—	resistivity	—	2003	T1	cond-mat/0309543
38.8	—	thin_film	resistivity	—	2003	T1	cond-mat/0304478
38.8	—	thin_film	resistivity	—	2003	T1	cond-mat/0307013
38.8	—	single_crystal	resistivity	—	2002	T2	cond-mat/0205230
38.8	ambient	polycrystal	resistivity, susceptibility	—	2001	T1	DOI: 10.1103/PhysRevLett.87.097001
38.8	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0105241
38.8	—	polycrystal	resistivity	—	2001	T2	cond-mat/0107154
38.8	—	polycrystal	resistivity	—	2001	T1	cond-mat/0103169
38.8	—	thin_film	resistivity	—	2001	T1	cond-mat/0103618
38.8	—	polycrystal	resistivity, susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.157002
38.8	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0104005
38.7	ambient	polycrystal	susceptibility	s-wave	2004	T1	cond-mat/0411719
38.7	—	single_crystal	susceptibility	—	2010	T1	DOI: 10.1103/PhysRevB.81.054520
38.7	—	polycrystal	specific_heat	—	2005	—	cond-mat/0510515
38.7	ambient	polycrystal	specific_heat	—	2005	T1	DOI: 10.1103/PhysRevB.72.220505
38.7	0.6	polycrystal	susceptibility	—	2005	T1	DOI: 10.1103/PhysRevB.72.220505
38.7	—	polycrystal	susceptibility	s-wave	2003	T1	DOI: 10.1103/PhysRevB.67.064505
38.7	—	polycrystal	resistivity	s-wave	2002	T1	cond-mat/0210175
38.7	—	powder	STM	—	2001	T2	cond-mat/0105146
38.7	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0105429
38.7	0.1	polycrystal	susceptibility	s-wave	2004	T1	cond-mat/0411719
38.6	ambient	single_crystal	susceptibility	—	2009	T1	DOI: 10.1103/PhysRevLett.102.117001
38.6	—	wire	susceptibility	—	2004	T1	cond-mat/0403454
38.6	—	polycrystal	susceptibility	—	2003	T1	DOI: 10.1103/PhysRevB.68.134509
38.6	—	single_crystal	resistivity	—	2003	T1	DOI: 10.1103/PhysRevB.68.060501
38.6	—	polycrystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.132508
38.6	—	wire	susceptibility	—	2002	T1	cond-mat/0205253
38.6	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0207263
38.6	—	polycrystal	susceptibility	—	2002	T2	cond-mat/0206444
38.6	—	thin_film	resistivity	—	2001	T3	cond-mat/0110296
38.6	—	thin_film	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.220506
38.6	—	polycrystal	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.64.060505
38.6	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0108172
38.6	—	thin_film	resistivity	—	2001	T1	cond-mat/0103569
38.6	—	—	susceptibility	—	2001	T2	cond-mat/0104112
38.5	—	polycrystal	resistivity	—	2020	T1	DOI: 10.1103/PhysRevB.101.035146
38.5	—	single_crystal	susceptibility	—	2010	—	1001.2199
38.5	—	single_crystal	susceptibility	—	2010	T1	DOI: 10.1103/PhysRevB.81.020506
38.5	ambient	single_crystal	susceptibility	—	2008	—	0807.3098
38.5	—	polycrystal	resistivity	—	2007	T1	0709.1691
38.5	—	single_crystal	susceptibility	—	2006	T1	DOI: 10.1103/PhysRevB.73.174509
38.5	—	thin_film	resistivity	—	2006	T1	cond-mat/0601669
38.5	—	single_crystal	—	—	2006	T2	cond-mat/0602102
38.5	—	—	susceptibility	—	2006	T1	cond-mat/0605195
38.5	—	polycrystal	—	—	2006	T1	cond-mat/0612159
38.5	—	single_crystal	STM	—	2005	T1	cond-mat/0505056
38.5	—	single_crystal	susceptibility	—	2005	T1	DOI: 10.1103/PhysRevB.71.024533
38.5	ambient	polycrystal	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.172508
38.5	—	single_crystal	susceptibility	—	2004	T1	cond-mat/0405120
38.5	—	single_crystal	resistivity	—	2004	T1	DOI: 10.1103/PhysRevB.70.144501
38.5	—	single_crystal	STM	—	2004	T2	cond-mat/0403700
38.5	—	single_crystal	susceptibility	—	2003	T1	cond-mat/0304400
38.5	—	single_crystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.65.140501
38.5	—	single_crystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevLett.89.187003
38.5	ambient	polycrystal	specific_heat	—	2002	T1	cond-mat/0207658
38.5	ambient	single_crystal	susceptibility	—	2001	T3	cond-mat/0112166
38.5	ambient	polycrystal	specific_heat, resistivity	s-wave	2001	T1	cond-mat/0102432
38.5	ambient	polycrystal	—	—	2001	T1	cond-mat/0105485
38.5	ambient	polycrystal	susceptibility	—	2001	T1	cond-mat/0102264
38.5	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0103514
38.5	—	—	susceptibility	s-wave	2001	T1	cond-mat/0102325
38.5	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0106518
38.4	—	—	—	—	2008	—	0811.2646
38.4	—	polycrystal	resistivity	—	2023	T1	DOI: 10.1103/PhysRevB.108.155146
38.4	—	polycrystal	resistivity	—	2009	T1	0907.1744
38.4	ambient	thin_film	resistivity	—	2004	T1	cond-mat/0406325
38.4	—	single_crystal	susceptibility	s-wave	2004	T1	DOI: 10.1103/PhysRevB.70.214516
38.4	ambient	polycrystal	resistivity	—	2002	T3	cond-mat/0202457
38.4	—	single_crystal	—	—	2002	T2	cond-mat/0209448
38.4	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0104454
38.4	3.0	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0102313
38.3	—	thin_film	resistivity	—	2025	T1	2509.19697
38.3	—	thin_film	resistivity	s-wave	2012	T1	1206.4532
38.3	—	thin_film	resistivity	s-wave	2012	T1	DOI: 10.1103/PhysRevB.86.024501
38.3	—	single_crystal	—	—	2011	T1	1112.2364
38.3	—	single_crystal	specific_heat	—	2005	T1	cond-mat/0501415
38.3	—	single_crystal	specific_heat	—	2005	T1	DOI: 10.1103/PhysRevB.72.060507
38.3	ambient	single_crystal	specific_heat	—	2005	T2	cond-mat/0504664
38.3	—	single_crystal	susceptibility	—	2004	T1	DOI: 10.1103/PhysRevB.69.054510
38.3	—	single_crystal	—	—	2003	T1	cond-mat/0304658
38.3	—	polycrystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.014505
38.3	—	single_crystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevLett.89.097002
38.3	—	single_crystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.052505
38.3	—	single_crystal	susceptibility	s-wave	2002	T1	cond-mat/0204199
38.3	ambient	single_crystal	susceptibility	—	2002	T2	cond-mat/0205561
38.3	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
38.3	0.8	polycrystal	susceptibility	s-wave	2001	T1	cond-mat/0104303
38.2	ambient	single_crystal	—	—	2002	T2	cond-mat/0209270
38.2	—	thin_film	resistivity	—	2014	T1	DOI: 10.1103/PhysRevSTAB.17.012001
38.2	—	single_crystal	susceptibility	—	2012	T1	DOI: 10.1103/PhysRevB.85.094511
38.2	—	polycrystal	resistivity	—	2003	T2	cond-mat/0311425
38.2	—	single_crystal	susceptibility, resistivity	s-wave	2002	T1	DOI: 10.1103/PhysRevLett.88.087001
38.2	—	single_crystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevLett.89.247004
38.2	—	single_crystal	resistivity	—	2002	T1	cond-mat/0202133
38.2	—	single_crystal	—	—	2002	T1	cond-mat/0206506
38.2	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0208060
38.2	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0209516
38.2	—	single_crystal	resistivity	—	2002	T1	cond-mat/0211134
38.2	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0205293
38.2	—	single_crystal	resistivity, susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.64.212509
38.2	—	polycrystal	susceptibility	—	2001	T3	cond-mat/0112170
38.2	ambient	polycrystal	susceptibility	—	2001	T2	cond-mat/0105402
38.2	—	single_crystal	susceptibility, resistivity	—	2001	T1	cond-mat/0105545
38.2	ambient	—	susceptibility	—	2001	T2	cond-mat/0102480
38.2	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0104568
38.2	—	polycrystal	susceptibility	s-wave	2001	T1	cond-mat/0106166
38.2	—	polycrystal	susceptibility	unknown	2001	T2	cond-mat/0106407
38.1	1.0	—	—	s-wave	2002	T2	cond-mat/0203195
38.1	—	single_crystal	susceptibility	—	2005	T1	DOI: 10.1103/PhysRevB.72.134525
38.1	—	—	resistivity	—	2003	T1	cond-mat/0311556
38.1	—	thin_film	susceptibility	—	2003	T1	cond-mat/0303337
38.1	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0102264
38.1	—	polycrystal	specific_heat	—	2001	T2	cond-mat/0106518
38.0	—	thin_film	resistivity	s-wave	2025	T1	DOI: 10.1103/g5rp-6vb1
38.0	—	thin_film	—	s-wave	2024	T1	2411.10852
38.0	—	polycrystal	susceptibility	—	2023	T1	DOI: 10.1103/PhysRevB.108.155146
38.0	—	single_crystal	—	s-wave	2021	T1	2101.04191
38.0	ambient	single_crystal	neutron	—	2019	T1	DOI: 10.1103/PhysRevB.99.060502
38.0	—	—	—	—	2018	T2	1811.07574
38.0	—	polycrystal	susceptibility	—	2016	T1	cond-mat/0401572
38.0	—	thin_film	susceptibility	s-wave	2012	T1	1206.4532
38.0	—	thin_film	susceptibility	s-wave	2012	T1	DOI: 10.1103/PhysRevB.86.024501
38.0	—	polycrystal	susceptibility	—	2009	T1	0907.1744
38.0	—	thin_film	susceptibility	—	2006	T1	DOI: 10.1103/PhysRevB.73.094510
38.0	—	polycrystal	susceptibility	—	2006	T1	cond-mat/0601359
38.0	—	thin_film	resistivity	—	2004	T1	cond-mat/0408597
38.0	—	polycrystal	—	—	2004	T1	cond-mat/0409622
38.0	—	thin_film	susceptibility, resistivity	—	2004	T2	cond-mat/0412776
38.0	—	—	—	s-wave	2004	T1	DOI: 10.1103/PhysRevB.69.056502
38.0	ambient	thin_film	resistivity	s-wave	2004	T1	cond-mat/0411116
38.0	ambient	single_crystal	susceptibility	s-wave	2003	T1	DOI: 10.1103/PhysRevB.67.094507
38.0	—	polycrystal	specific_heat	—	2003	T1	DOI: 10.1103/PhysRevB.68.094514
38.0	—	single_crystal	—	—	2003	T1	cond-mat/0301051
38.0	—	—	—	s-wave	2003	T2	cond-mat/0306472
38.0	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0302245
38.0	—	thin_film	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.064512
38.0	—	polycrystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.132506
38.0	—	single_crystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevLett.89.097001
38.0	ambient	single_crystal	resistivity, susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.100510
38.0	—	single_crystal	susceptibility	s-wave	2002	T1	DOI: 10.1103/PhysRevB.66.052505
38.0	—	—	resistivity	—	2002	T1	cond-mat/0204510
38.0	—	single_crystal	—	—	2002	T1	cond-mat/0205596
38.0	—	thin_film	resistivity	—	2002	T2	cond-mat/0206207
38.0	—	polycrystal	resistivity, susceptibility	—	2002	T1	cond-mat/0206518
38.0	ambient	single_crystal	susceptibility	—	2002	T1	cond-mat/0207658
38.0	ambient	polycrystal	specific_heat	—	2002	T1	cond-mat/0210706
38.0	—	—	—	—	2002	T2	cond-mat/0212417
38.0	—	polycrystal	—	—	2002	T3	cond-mat/0201200
38.0	—	thin_film	susceptibility	s-wave	2002	T3	cond-mat/0201550
38.0	—	thin_film	—	—	2002	T1	cond-mat/0210048
38.0	—	polycrystal	susceptibility	—	2001	T3	cond-mat/0110158
38.0	—	thin_film	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.220506
38.0	—	powder	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.65.020503
38.0	—	polycrystal	specific_heat	—	2001	T1	cond-mat/0106394
38.0	—	thin_film	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.140503
38.0	—	—	—	—	2001	T1	DOI: 10.1103/PhysRevB.64.140509
38.0	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.177006
38.0	—	thin_film	susceptibility	—	2001	T2	cond-mat/0104249
38.0	—	—	resistivity	—	2001	T1	cond-mat/0104411
38.0	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0104489
38.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0105275
38.0	—	single_crystal	resistivity, susceptibility	—	2001	T2	cond-mat/0105330
38.0	—	thin_film	—	—	2001	T1	cond-mat/0107240
38.0	—	—	susceptibility	—	2001	T1	cond-mat/0108215
38.0	—	thin_film	susceptibility	—	2001	T1	cond-mat/0109465
38.0	ambient	—	susceptibility	—	2001	T2	cond-mat/0102215
38.0	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0103407
38.0	—	wire	—	s-wave	2001	T1	cond-mat/0104038
38.0	—	polycrystal	resistivity	—	2001	T2	cond-mat/0106344
38.0	—	polycrystal	resistivity	—	2001	T1	cond-mat/0107057
38.0	—	single_crystal	susceptibility	s-wave	2001	T3	cond-mat/0110109
37.9	—	single_crystal	susceptibility	—	2003	T1	cond-mat/0304400
37.9	—	polycrystal	resistivity	—	2002	T2	cond-mat/0212385
37.9	—	polycrystal	susceptibility	—	2001	T3	cond-mat/0112170
37.7	1.2	—	—	—	2014	T1	1412.4860
37.7	—	thin_film	resistivity	—	2011	T1	1112.1908
37.7	—	single_crystal	susceptibility	—	2003	T1	DOI: 10.1103/PhysRevB.68.100508
37.6	—	—	—	—	2018	T2	1811.07574
37.6	—	thin_film	—	—	2011	T1	1112.0640
37.6	—	thin_film	—	—	2004	T1	cond-mat/0406539
37.6	—	single_crystal	resistivity	—	2002	T1	cond-mat/0209516
37.6	—	thin_film	resistivity	—	2001	T1	cond-mat/0103179
37.5	ambient	polycrystal	susceptibility	—	2010	T1	DOI: 10.1103/PhysRevB.81.094501
37.5	—	thin_film	susceptibility	—	2017	T1	DOI: 10.1103/PhysRevAccelBeams.20.102002
37.5	—	polycrystal	susceptibility	—	2006	T1	DOI: 10.1103/PhysRevB.74.132506
37.5	—	polycrystal	resistivity, susceptibility	—	2004	T1	cond-mat/0405706
37.5	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0307318
37.5	—	polycrystal	susceptibility	unknown	2002	T1	DOI: 10.1103/PhysRevB.65.174522
37.5	—	thin_film	susceptibility	—	2001	T1	cond-mat/0103179
37.5	ambient	—	susceptibility	—	2001	T1	cond-mat/0107034
37.5	—	powder	susceptibility, muSR	—	2001	T1	DOI: 10.1103/PhysRevB.64.094514
37.5	—	polycrystal	susceptibility, specific_heat	s-wave	2001	T1	DOI: 10.1103/PhysRevB.64.172515
37.5	—	powder	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevLett.86.5582
37.5	ambient	—	specific_heat	—	2001	T2	cond-mat/0104203
37.5	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0105215
37.5	ambient	—	susceptibility, resistivity	—	2001	T2	cond-mat/0102215
37.5	—	powder	susceptibility	s-wave	2001	T2	cond-mat/0101463
37.5	ambient	polycrystal	resistivity	—	2001	T1	cond-mat/0105152
37.5	ambient	powder	susceptibility	—	2001	T1	cond-mat/0107205
37.5	—	powder	susceptibility	—	2001	T2	cond-mat/0102242
37.5	—	polycrystal	specific_heat, susceptibility	s-wave	2001	T2	cond-mat/0102522
37.5	—	powder	susceptibility, muSR	—	2001	T1	cond-mat/0103060
37.4	1.1	polycrystal	susceptibility	s-wave	2004	T1	cond-mat/0411719
37.4	ambient	polycrystal	susceptibility	—	2001	T1	cond-mat/0102264
37.2	ambient	polycrystal	resistivity, susceptibility	—	2008	—	0807.1203
37.1	—	—	susceptibility	—	2014	T1	1406.2414
37.0	—	polycrystal	susceptibility	—	2003	T1	DOI: 10.1103/PhysRevB.68.134509
37.0	—	polycrystal	resistivity	—	2022	T1	DOI: 10.1103/PhysRevB.106.224417
37.0	—	thin_film	susceptibility	—	2017	T1	DOI: 10.1103/PhysRevAccelBeams.20.102002
37.0	—	thin_film	resistivity	—	2011	—	1112.1911
37.0	—	thin_film	resistivity	—	2011	T1	1102.5623
37.0	—	polycrystal	resistivity	—	2010	T1	DOI: 10.1103/PhysRevLett.104.035701
37.0	—	polycrystal	susceptibility	—	2007	T1	0708.3885
37.0	—	single_crystal	STM	—	2006	T1	cond-mat/0604316
37.0	—	thin_film	resistivity	—	2005	T1	cond-mat/0507519
37.0	—	polycrystal	STM	s-wave	2002	T1	DOI: 10.1103/PhysRevLett.89.187002
37.0	—	polycrystal	susceptibility	—	2002	T1	cond-mat/0203126
37.0	ambient	polycrystal	resistivity	—	2002	T1	cond-mat/0204208
37.0	—	thin_film	—	—	2002	T1	cond-mat/0208476
37.0	—	polycrystal	specific_heat	—	2002	T1	cond-mat/0208169
37.0	—	polycrystal	susceptibility	—	2001	T1	DOI: 10.1103/PhysRevB.64.012511
37.0	—	thin_film	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.140503
37.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0105275
37.0	—	—	susceptibility	—	2001	T1	cond-mat/0103302
36.8	ambient	—	—	—	2025	—	2503.10943
36.7	—	polycrystal	specific_heat, susceptibility	—	2001	T1	cond-mat/0103181
36.6	—	—	—	—	2001	T1	cond-mat/0104560
36.5	—	single_crystal	specific_heat	—	2006	T1	DOI: 10.1103/PhysRevB.73.224528
36.5	—	single_crystal	susceptibility	—	2003	T1	cond-mat/0307388
36.5	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.177006
36.5	—	polycrystal	susceptibility, ARPES	—	2001	T2	cond-mat/0104489
36.5	—	polycrystal	muSR	s-wave	2002	T2	cond-mat/0212022
36.4	—	polycrystal	resistivity	—	2003	T2	cond-mat/0311425
36.4	—	thin_film	—	—	2002	T1	cond-mat/0207406
36.3	—	thin_film	—	—	2004	T1	cond-mat/0403665
36.1	—	thin_film	resistivity	—	2006	—	cond-mat/0606606
36.0	—	polycrystal	resistivity	—	2023	T1	DOI: 10.1103/PhysRevB.108.155146
36.0	—	thin_film	resistivity	—	2023	T1	DOI: 10.1103/PhysRevLett.131.186903
36.0	—	thin_film	resistivity	—	2023	T1	2308.00775
36.0	—	thin_film	resistivity, susceptibility	—	2021	T1	DOI: 10.1103/PhysRevB.104.L140505
36.0	—	thin_film	resistivity	—	2020	T1	2010.05019
36.0	—	polycrystal	susceptibility	—	2007	T1	0708.3885
36.0	—	thin_film	resistivity	—	2004	T1	cond-mat/0401569
36.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0412776
36.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
36.0	—	single_crystal	resistivity, specific_heat	—	2003	T1	DOI: 10.1103/PhysRevB.68.172502
36.0	—	single_crystal	susceptibility, ARPES	s-wave	2003	T1	DOI: 10.1103/PhysRevLett.91.127001
36.0	—	—	susceptibility	—	2003	T1	cond-mat/0302443
36.0	—	single_crystal	resistivity	—	2003	T2	cond-mat/0307445
36.0	—	thin_film	susceptibility	—	2003	T1	cond-mat/0302245
36.0	—	thin_film	—	—	2002	T2	cond-mat/0211310
36.0	—	thin_film	—	—	2001	T3	cond-mat/0111404
36.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0107031
35.9	—	polycrystal	resistivity	—	2006	T1	cond-mat/0602506
35.5	—	thin_film	resistivity	—	2011	T1	1112.4044
35.5	ambient	single_crystal	susceptibility	—	2010	T1	DOI: 10.1103/PhysRevLett.105.047001
35.5	ambient	polycrystal	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.172508
35.5	—	single_crystal	resistivity, specific_heat	s-wave	2003	T1	cond-mat/0308319
35.4	ambient	polycrystal	susceptibility	—	2010	T1	DOI: 10.1103/PhysRevB.81.094501
35.0	—	wire	resistivity	—	2006	T1	cond-mat/0607223
35.0	—	thin_film	resistivity	—	2005	T1	DOI: 10.1103/PhysRevB.71.012504
35.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
35.0	—	thin_film	resistivity	s-wave	2003	T1	DOI: 10.1103/PhysRevLett.91.197004
35.0	—	thin_film	—	—	2002	T1	cond-mat/0204004
35.0	—	thin_film	resistivity	—	2002	T1	cond-mat/0203322
35.0	—	—	resistivity	s-wave	2001	T2	cond-mat/0107478
35.0	—	polycrystal	STM	s-wave	2001	T2	cond-mat/0102312
34.9	—	—	—	—	2008	—	0811.2646
34.9	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
34.5	—	—	resistivity	—	2003	T1	cond-mat/0311556
34.5	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.127001
34.5	—	polycrystal	resistivity	s-wave	2001	T2	cond-mat/0107239
34.4	—	polycrystal	resistivity	—	2009	T1	0910.5681
34.1	—	single_crystal	—	—	2011	T1	1112.2364
34.1	—	—	—	—	2005	T1	DOI: 10.1103/PhysRevLett.94.037004
34.1	—	—	—	—	2004	T2	cond-mat/0408688
34.1	—	polycrystal	specific_heat	—	2002	T1	cond-mat/0208169
34.0	—	thin_film	resistivity	—	2011	T1	1102.5625
34.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
34.0	—	thin_film	resistivity	—	2003	T1	DOI: 10.1103/PhysRevLett.91.267002
34.0	—	single_crystal	specific_heat	s-wave	2003	T1	cond-mat/0308319
34.0	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0307318
34.0	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.66.104510
34.0	—	single_crystal	—	—	2002	T2	cond-mat/0209472
34.0	—	polycrystal	resistivity	—	2002	T3	cond-mat/0201450
34.0	—	thin_film	resistivity	—	2002	T1	cond-mat/0212009
34.0	—	thin_film	resistivity	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.88.027003
34.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0105080
34.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0106342
34.0	—	thin_film	—	—	2001	T1	cond-mat/0106278
33.8	—	thin_film	resistivity	—	2003	T1	DOI: 10.1103/PhysRevB.67.020507
33.8	—	thin_film	microwave	—	2002	T2	cond-mat/0207655
33.5	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
33.4	—	polycrystal	resistivity	—	2020	T1	DOI: 10.1103/PhysRevB.101.035146
33.2	—	—	resistivity	—	2008	T1	0802.1355
33.1	—	thin_film	resistivity	—	2005	T1	cond-mat/0503730
33.1	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
33.0	—	thin_film	resistivity	s-wave	2025	T1	DOI: 10.1103/b5h4-ppdf
33.0	—	thin_film	resistivity	—	2023	T1	2301.01669
33.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0412776
33.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
33.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0404252
33.0	—	thin_film	resistivity	s-wave	2002	T1	DOI: 10.1103/PhysRevB.65.052413
33.0	—	thin_film	resistivity	—	2002	T1	cond-mat/0206442
33.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0105612
33.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0108212
33.0	—	thin_film	susceptibility	—	2001	T3	cond-mat/0110312
32.8	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
32.6	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
32.5	—	thin_film	susceptibility	—	2024	T1	DOI: 10.1103/PhysRevB.110.094502
32.3	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
32.0	—	thin_film	resistivity	—	2023	T1	DOI: 10.1103/PhysRevLett.131.186903
32.0	—	thin_film	resistivity	—	2023	T1	2308.00775
32.0	—	thin_film	—	—	2019	T1	1911.01480
32.0	—	polycrystal	resistivity	—	2005	T1	cond-mat/0503614
32.0	—	thin_film	resistivity	s-wave	2005	T1	DOI: 10.1103/PhysRevLett.94.227005
32.0	—	thin_film	resistivity, susceptibility	—	2004	T2	cond-mat/0404415
32.0	—	—	—	s-wave	2002	T1	DOI: 10.1103/PhysRevB.65.132518
32.0	—	thin_film	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.172502
32.0	ambient	polycrystal	resistivity	—	2002	T1	cond-mat/0204208
32.0	—	thin_film	susceptibility	—	2001	T3	cond-mat/0109449
32.0	—	thin_film	susceptibility, resistivity	—	2001	T2	cond-mat/0104291
31.9	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
31.9	—	thin_film	susceptibility	—	2001	T1	cond-mat/0107259
31.5	—	thin_film	susceptibility	—	2024	T1	DOI: 10.1103/PhysRevB.110.094502
31.3	—	thin_film	resistivity	—	2007	T1	0705.4140
31.3	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
31.2	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
31.2	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
31.1	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
31.0	—	thin_film	resistivity	—	2007	T1	0705.4229
31.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0404415
31.0	—	thin_film	resistivity	s-wave	2002	T1	cond-mat/0212009
31.0	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.127001
31.0	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
30.6	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
30.5	—	thin_film	resistivity	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.88.027003
30.5	—	thin_film	resistivity	—	2001	T2	cond-mat/0106342
30.2	—	polycrystal	specific_heat	—	2002	T1	cond-mat/0208169
30.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404382
30.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0404415
30.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404708
30.0	—	polycrystal	STM	—	2002	T1	DOI: 10.1103/PhysRevLett.88.127002
30.0	—	—	—	—	2002	T3	cond-mat/0202285
30.0	—	thin_film	—	—	2001	T1	cond-mat/0107240
30.0	—	—	—	s-wave	2001	T2	cond-mat/0102389
29.5	—	—	resistivity	—	2003	T1	cond-mat/0309543
29.5	—	thin_film	resistivity	—	2003	T1	cond-mat/0304478
29.5	—	thin_film	resistivity	—	2003	T1	cond-mat/0307013
29.5	—	thin_film	STM	—	2001	T1	cond-mat/0108212
29.4	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
29.4	—	—	—	—	2001	T3	cond-mat/0111262
29.0	—	thin_film	—	—	2024	T1	2410.22167
29.0	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
29.0	—	polycrystal	susceptibility	s-wave	2001	T1	DOI: 10.1103/PhysRevLett.87.127001
29.0	—	—	resistivity	s-wave	2001	T2	cond-mat/0107478
29.0	—	polycrystal	susceptibility	—	2001	T2	cond-mat/0102334
28.8	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
28.3	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
28.2	—	thin_film	resistivity	—	2004	T2	cond-mat/0404252
28.1	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
28.0	—	—	—	s-wave	2007	T2	cond-mat/0703201
28.0	—	thin_film	susceptibility	—	2003	T1	cond-mat/0310755
27.5	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.66.104510
27.5	—	polycrystal	resistivity	—	2002	T3	cond-mat/0201450
27.5	—	polycrystal	—	—	2001	T1	cond-mat/0107534
27.2	3.0	polycrystal	resistivity	—	2001	T2	cond-mat/0103161
27.1	—	thin_film	resistivity	—	2010	T1	1008.3325
27.0	—	thin_film	—	s-wave	2017	T1	DOI: 10.1103/PhysRevB.96.094510
27.0	—	thin_film	resistivity	—	2004	T1	cond-mat/0408597
27.0	—	single_crystal	resistivity	—	2002	T2	cond-mat/0210358
27.0	—	powder	susceptibility, muSR	—	2001	T1	DOI: 10.1103/PhysRevB.65.012510
27.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0105612
27.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103198
27.0	—	powder	—	—	2001	T2	cond-mat/0107511
26.5	—	—	—	—	2005	T2	cond-mat/0502659
26.5	—	polycrystal	resistivity	—	2001	T2	cond-mat/0105241
26.2	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
26.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0404415
26.0	—	—	—	—	2002	T3	cond-mat/0202172
26.0	8.0	—	—	—	2001	T2	cond-mat/0102480
25.8	—	thin_film	resistivity	—	2010	T1	1008.3325
25.6	ambient	—	—	—	2025	—	2503.10943
25.6	—	thin_film	resistivity	—	2010	T1	1008.3325
25.4	—	—	—	—	2001	T3	cond-mat/0111115
25.0	—	thin_film	resistivity	—	2026	T1	2604.14022
25.0	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0302245
25.0	—	thin_film	—	—	2001	T1	cond-mat/0103572
25.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0104309
25.0	—	thin_film	resistivity	—	2001	T2	cond-mat/0107154
25.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103618
24.3	—	polycrystal	resistivity	—	2006	T1	cond-mat/0602506
24.2	—	thin_film	resistivity	—	2010	T1	1008.3325
24.0	—	—	—	—	2016	T1	DOI: 10.1103/PhysRevB.94.144506
24.0	30.0	—	—	s-wave	2009	T1	DOI: 10.1103/PhysRevB.79.094518
24.0	—	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.174506
24.0	—	—	—	s-wave	2003	T2	cond-mat/0306472
24.0	—	thin_film	—	—	2002	T1	cond-mat/0203532
24.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103588
24.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103618
24.0	—	thin_film	—	—	2001	T1	cond-mat/0103478
23.0	—	—	—	—	2023	T1	DOI: 10.1103/PhysRevB.107.184518
23.0	—	thin_film	—	s-wave	2017	T1	DOI: 10.1103/PhysRevB.96.094510
23.0	—	polycrystal	resistivity	—	2002	T1	DOI: 10.1103/PhysRevB.66.104510
23.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103543
22.8	ambient	wire	susceptibility	—	2004	T2	cond-mat/0411149
22.2	—	thin_film	resistivity	—	2006	—	cond-mat/0606606
22.0	—	thin_film	resistivity	—	2010	T1	1008.3325
22.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0412776
22.0	—	—	—	—	2002	T2	cond-mat/0210091
22.0	—	thin_film	susceptibility	—	2001	T1	cond-mat/0103542
22.0	—	—	—	—	2001	T2	cond-mat/0103570
21.7	—	—	—	—	2003	T2	cond-mat/0302411
21.6	—	thin_film	resistivity	—	2026	T1	2604.14022
21.0	—	polycrystal	specific_heat	—	2006	T1	DOI: 10.1103/PhysRevLett.96.077003
20.9	19.2	powder	susceptibility	—	2001	T2	cond-mat/0106057
20.8	—	—	susceptibility	—	2008	T1	0802.3971
20.0	—	thin_film	susceptibility	—	2024	T1	DOI: 10.1103/PhysRevB.110.094502
20.0	—	thin_film	—	—	2023	T3	2308.15228
20.0	—	thin_film	—	s-wave	2017	T1	DOI: 10.1103/PhysRevB.96.094510
20.0	—	polycrystal	resistivity	s-wave	2012	T1	DOI: 10.1103/PhysRevB.86.104502
20.0	—	polycrystal	resistivity	s-wave	2011	T1	1110.3960
20.0	—	thin_film	resistivity	—	2006	T1	cond-mat/0601684
20.0	—	wire	resistivity	—	2005	—	cond-mat/0506562
20.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0412776
20.0	20.5	single_crystal	susceptibility	—	2004	T2	cond-mat/0412042
20.0	—	single_crystal	STM	—	2002	T2	cond-mat/0209387
20.0	—	wire	—	s-wave	2001	T1	cond-mat/0104038
19.5	ambient	thin_film	resistivity	—	2002	T3	cond-mat/0201439
19.0	—	—	—	s-wave	2004	T3	cond-mat/0410158
19.0	—	thin_film	resistivity	—	2003	T1	cond-mat/0305466
19.0	—	thin_film	susceptibility	—	2002	T3	cond-mat/0201260
18.9	—	thin_film	resistivity	—	2010	T1	1008.3325
18.9	—	—	susceptibility	—	2008	T1	0802.3971
18.6	—	—	—	—	2023	T1	2304.14682
18.0	—	—	—	s-wave	2007	T2	cond-mat/0703201
17.0	—	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.174506
17.0	—	thin_film	resistivity	—	2006	—	cond-mat/0606606
16.5	ambient	—	—	—	2025	—	2503.10943
15.0	32.0	polycrystal	—	—	2002	T2	cond-mat/0209270
14.5	—	thin_film	STM	—	2001	T1	cond-mat/0108212
13.3	—	—	—	s-wave	2007	T2	cond-mat/0703201
13.2	—	powder	STM	—	2001	T1	DOI: 10.1103/PhysRevLett.86.5582
13.2	—	polycrystal	STM	s-wave	2001	T2	cond-mat/0102242
12.7	—	wire	resistivity	—	2005	—	cond-mat/0506562
12.5	—	thin_film	resistivity	—	2003	T1	cond-mat/0305466
12.3	ambient	—	—	—	2025	—	2503.10943
12.2	—	polycrystal	resistivity	—	2006	T1	cond-mat/0602506
12.0	—	thin_film	resistivity	—	2001	T1	cond-mat/0103198
11.6	—	thin_film	—	—	2022	T1	DOI: 10.1103/PhysRevMaterials.6.024803
11.6	ambient	thin_film	—	—	2021	T3	2112.04317
11.0	—	polycrystal	specific_heat	—	2006	T1	DOI: 10.1103/PhysRevLett.96.077003
9.1	—	polycrystal	resistivity	—	2007	T1	0709.0618
9.0	—	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.174506
8.7	—	polycrystal	specific_heat	—	2006	T1	DOI: 10.1103/PhysRevLett.96.077003
8.5	—	—	specific_heat	—	2005	T1	cond-mat/0508582
8.0	—	thin_film	susceptibility	—	2004	T2	cond-mat/0412776
7.0	—	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.77.174506
7.0	—	polycrystal	susceptibility	—	2002	T1	DOI: 10.1103/PhysRevB.65.132506
7.0	—	polycrystal	susceptibility	—	2001	T3	cond-mat/0110158
5.0	—	thin_film	STM	—	2015	T1	DOI: 10.1103/PhysRevB.92.064514
5.0	—	wire	—	—	2006	T1	DOI: 10.1103/PhysRevB.73.134512
5.0	—	polycrystal	resistivity, susceptibility	—	2001	T2	cond-mat/0103344
3.0	—	thin_film	resistivity	—	2025	T1	2509.19697
2.0	137.0	—	—	—	2006	T2	cond-mat/0608589
—	—	—	—	—	2026	T3	2601.21044
—	—	—	—	—	2026	T1	2603.20719
—	—	—	optical_spectroscopy	—	2025	—	2503.02779
—	—	—	—	—	2025	T1	2509.00563
—	—	—	susceptibility	—	2025	—	2506.23616
—	ambient	—	—	—	2024	T1	2404.00719
—	—	polycrystal	—	—	2023	T1	DOI: 10.1103/PhysRevB.107.064310
—	—	polycrystal	STM	—	2023	T1	2301.02929
—	—	polycrystal	susceptibility	—	2023	T3	2307.16404
—	—	—	susceptibility	—	2022	T1	2201.06016
—	—	—	resistivity, susceptibility	—	2022	T1	2209.08493
—	—	—	resistivity	—	2022	—	2204.00151
—	—	—	specific_heat	—	2022	—	2206.10072
—	—	—	susceptibility	—	2022	—	2206.10940
—	—	—	—	—	2022	T1	2212.08117
—	—	—	—	—	2022	T1	2203.15648
—	—	—	—	—	2022	T3	2207.10134
—	—	thin_film	resistivity	—	2022	T1	2207.12361
—	—	—	—	—	2021	T3	2102.02380
—	—	—	—	—	2021	T2	2109.10247
—	—	polycrystal	susceptibility	—	2020	T3	2010.00842
—	—	—	susceptibility	—	2020	T1	2012.11146
—	—	single_crystal	neutron	—	2019	T1	1902.04565
—	—	—	—	—	2019	T1	1904.03062
—	—	—	—	—	2019	T2	1905.08559
—	—	—	—	—	2018	—	1801.03438
—	—	thin_film	—	—	2018	T1	1811.05814
—	—	single_crystal	neutron	—	2018	T3	1812.05970
—	—	—	susceptibility	—	2018	T1	1805.04683
—	—	thin_film	susceptibility	—	2017	T2	1709.00836
—	—	—	resistivity	—	2016	T1	1603.08330
—	—	—	—	—	2016	T1	DOI: 10.1103/PhysRevB.93.184510
—	—	single_crystal	ARPES	s-wave	2015	—	1504.06347
—	—	—	resistivity	—	2015	T1	1510.02234
—	—	thin_film	resistivity	—	2014	T1	1403.5600
—	—	wire	resistivity	—	2014	—	1407.2111
—	—	wire	resistivity	—	2014	—	1409.6185
—	—	wire	resistivity, susceptibility	—	2014	T1	1405.4112
—	—	wire	resistivity	—	2014	T1	1406.2141
—	—	—	—	—	2014	T1	1407.3717
—	—	polycrystal	resistivity, susceptibility	—	2014	T1	1405.4124
—	—	—	microwave	—	2013	T1	1312.6257
—	—	polycrystal	resistivity	—	2013	T1	1307.7525
—	—	thin_film	resistivity, susceptibility	—	2013	T1	1303.0352
—	—	—	—	—	2013	T1	1303.5642
—	—	—	susceptibility	—	2013	T1	1308.2204
—	—	—	—	—	2012	T1	1205.0112
—	—	polycrystal	—	—	2012	T1	1207.6982
—	—	single_crystal	neutron	—	2012	T1	1202.5660
—	—	—	—	—	2012	T1	1207.6486
—	—	—	specific_heat	—	2011	T2	1107.5024
—	—	polycrystal	resistivity	—	2011	T1	1109.4333
—	—	—	resistivity	—	2011	T1	1106.2862
—	—	wire	resistivity, susceptibility	—	2011	T1	1108.5775
—	—	single_crystal	susceptibility	—	2011	—	1101.2596
—	—	—	specific_heat	—	2011	—	1102.2287
—	—	—	resistivity, susceptibility	—	2011	—	1109.4517
—	—	polycrystal	—	—	2011	T3	1111.6365
—	—	single_crystal	—	—	2011	—	1109.1969
—	—	wire	resistivity, susceptibility	—	2011	T3	1102.5573
—	—	—	susceptibility	—	2010	T1	1008.2948
—	—	polycrystal	—	—	2010	T3	1008.3174
—	—	wire	resistivity	—	2010	—	1010.0925
—	—	—	resistivity	—	2010	T1	1003.3158
—	—	—	—	—	2010	T1	1012.3330
—	—	—	—	—	2010	—	1001.5099
—	—	single_crystal	—	—	2010	—	1002.0799
—	—	polycrystal	resistivity	—	2009	T1	0907.2129
—	—	—	resistivity	—	2009	T3	0908.0815
—	—	thin_film	susceptibility	—	2009	T1	0908.2110
—	2.0	—	—	—	2009	T3	0912.4903
—	—	wire	resistivity	—	2009	T3	0911.3000
—	ambient	polycrystal	resistivity	s-wave	2009	T1	0903.2162
—	—	—	susceptibility	—	2009	T1	0909.2186
—	—	single_crystal	susceptibility	s-wave	2009	T1	DOI: 10.1103/PhysRevB.80.014507
—	—	—	resistivity	—	2008	—	0810.1558
—	—	wire	—	—	2008	—	0810.2438
—	—	thin_film	resistivity	—	2008	—	0811.1253
—	—	—	resistivity	—	2008	T1	0803.0373
—	—	thin_film	resistivity	—	2008	T1	0809.2297
—	—	—	—	—	2008	T3	0811.0897
—	—	polycrystal	resistivity	—	2008	T1	0803.2078
—	—	—	susceptibility	—	2008	T2	cond-mat/0607318
—	—	—	—	—	2008	T1	0812.3039
—	—	polycrystal	resistivity	—	2008	T1	0807.4078
—	—	polycrystal	resistivity, susceptibility	—	2008	T1	0811.0986
—	—	wire	—	—	2008	T3	0807.3259
—	—	thin_film	resistivity	—	2007	T1	0709.4001
—	ambient	single_crystal	—	—	2007	T1	0710.2801
—	—	polycrystal	resistivity	—	2007	T1	0709.0840
—	—	polycrystal	—	—	2007	T1	0710.0111
—	—	thin_film	resistivity	—	2007	T1	0710.4581
—	—	wire	—	—	2007	T1	0712.2273
—	—	polycrystal	resistivity, susceptibility	—	2007	T1	0711.4174
—	—	single_crystal	specific_heat	—	2007	T1	DOI: 10.1103/PhysRevLett.98.137001
—	—	polycrystal	susceptibility, resistivity	—	2007	T1	DOI: 10.1103/PhysRevB.76.104521
—	—	single_crystal	—	—	2007	T1	cond-mat/0701085
—	—	thin_film	resistivity	—	2007	T1	cond-mat/0701780
—	—	thin_film	susceptibility	—	2007	T1	cond-mat/0702484
—	—	thin_film	STM	—	2006	T1	cond-mat/0602023
—	—	—	resistivity	—	2006	—	cond-mat/0607676
—	—	wire	—	—	2006	T1	cond-mat/0603566
—	—	polycrystal	—	—	2006	T1	cond-mat/0606576
—	—	—	—	—	2006	T1	cond-mat/0608143
—	—	single_crystal	—	—	2006	T2	cond-mat/0612145
—	ambient	polycrystal	susceptibility	—	2006	T1	cond-mat/0603536
—	—	—	susceptibility	—	2006	T2	cond-mat/0606562
—	—	thin_film	—	—	2006	T1	cond-mat/0607063
—	ambient	—	—	—	2006	T2	cond-mat/0608589
—	100.0	—	—	—	2006	T2	cond-mat/0608589
—	ambient	polycrystal	resistivity	—	2006	T1	cond-mat/0608700
—	—	thin_film	resistivity	—	2006	T1	cond-mat/0608706
—	—	polycrystal	resistivity	—	2006	T2	cond-mat/0610286
—	—	polycrystal	resistivity, susceptibility	—	2006	T1	cond-mat/0610295
—	—	—	resistivity	—	2006	T1	cond-mat/0612472
—	—	polycrystal	—	—	2006	—	cond-mat/0603648
—	—	polycrystal	—	—	2006	—	cond-mat/0607292
—	—	thin_film	—	—	2006	—	cond-mat/0607532
—	—	thin_film	—	—	2006	T1	cond-mat/0608549
—	—	thin_film	—	—	2006	T3	cond-mat/0609427
—	—	wire	resistivity	—	2005	T3	cond-mat/0507510
—	—	thin_film	resistivity	—	2005	T1	cond-mat/0503761
—	—	wire	resistivity	—	2005	T1	cond-mat/0503755
—	—	single_crystal	STM	—	2005	T1	cond-mat/0505056
—	—	polycrystal	—	—	2005	T3	cond-mat/0509086
—	—	single_crystal	neutron	—	2005	T1	cond-mat/0511376
—	—	thin_film	—	—	2005	—	cond-mat/0505165
—	—	thin_film	resistivity	—	2005	—	cond-mat/0505764
—	ambient	polycrystal	susceptibility	—	2005	—	cond-mat/0506779
—	—	polycrystal	resistivity	—	2005	—	cond-mat/0509475
—	0.6	polycrystal	susceptibility	—	2005	—	cond-mat/0510515
—	—	thin_film	resistivity, susceptibility	—	2005	T1	cond-mat/0508151
—	—	polycrystal	resistivity	—	2005	T3	cond-mat/0512046
—	—	—	—	—	2005	T3	cond-mat/0502153
—	—	polycrystal	susceptibility, resistivity	—	2005	T1	cond-mat/0503758
—	ambient	single_crystal	resistivity	—	2005	T2	cond-mat/0504664
—	—	polycrystal	resistivity	—	2005	T1	cond-mat/0504793
—	—	polycrystal	—	—	2005	T1	cond-mat/0505653
—	—	wire	resistivity	—	2005	T2	cond-mat/0507185
—	—	thin_film	—	—	2005	T1	cond-mat/0507489
—	—	polycrystal	resistivity	—	2005	T1	cond-mat/0507652
—	—	polycrystal	susceptibility, resistivity	—	2005	T2	cond-mat/0511701
—	—	polycrystal	—	—	2005	T1	cond-mat/0511703
—	ambient	powder	susceptibility	—	2005	T3	cond-mat/0507083
—	—	—	—	s-wave	2004	T2	cond-mat/0402668
—	—	single_crystal	susceptibility	—	2004	T3	cond-mat/0403140
—	—	single_crystal	susceptibility	—	2004	T1	cond-mat/0403198
—	—	—	—	—	2004	T3	cond-mat/0404628
—	ambient	thin_film	resistivity	—	2004	T1	cond-mat/0406325
—	—	—	resistivity	—	2004	T1	cond-mat/0409402
—	—	wire	resistivity	—	2004	T1	cond-mat/0410399
—	ambient	wire	resistivity	—	2004	T1	cond-mat/0410450
—	—	thin_film	resistivity	—	2004	T2	cond-mat/0412776
—	—	thin_film	resistivity	—	2004	T1	DOI: 10.1103/PhysRevB.69.100501
—	—	single_crystal	—	—	2004	T1	DOI: 10.1103/PhysRevB.69.100504
—	—	polycrystal	susceptibility, resistivity	—	2004	T2	cond-mat/0411531
—	—	polycrystal	susceptibility	—	2004	T1	DOI: 10.1103/PhysRevB.69.012507
—	—	thin_film	resistivity	—	2004	T3	cond-mat/0406294
—	—	thin_film	resistivity	—	2004	T2	cond-mat/0405246
—	—	wire	susceptibility	—	2004	T1	cond-mat/0401184
—	—	—	muSR	—	2004	T1	cond-mat/0401454
—	—	polycrystal	resistivity, susceptibility	—	2004	T1	cond-mat/0404052
—	—	thin_film	resistivity	—	2004	T2	cond-mat/0404415
—	—	polycrystal	resistivity	—	2004	T1	cond-mat/0405567
—	—	thin_film	resistivity	—	2004	T1	cond-mat/0406313
—	—	—	resistivity	—	2004	T2	cond-mat/0410480
—	—	thin_film	resistivity	—	2004	T1	cond-mat/0410655
—	—	polycrystal	—	—	2004	T1	cond-mat/0411199
—	—	polycrystal	—	—	2004	T2	cond-mat/0411616
—	13.4	single_crystal	susceptibility	—	2004	T2	cond-mat/0412042
—	—	thin_film	—	—	2004	T1	cond-mat/0412345
—	—	—	—	—	2004	T3	cond-mat/0409408
—	—	thin_film	—	—	2004	T1	cond-mat/0403755
—	—	wire	susceptibility, resistivity	—	2004	T1	cond-mat/0405219
—	—	thin_film	—	—	2003	T2	cond-mat/0309664
—	0.2	polycrystal	—	—	2003	T1	cond-mat/0310213
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0312069
—	—	thin_film	resistivity	s-wave	2003	T1	cond-mat/0304051
—	ambient	—	thermal_conductivity	—	2003	T2	cond-mat/0304416
—	—	thin_film	STM	—	2003	T1	cond-mat/0307540
—	—	thin_film	resistivity	—	2003	T1	DOI: 10.1103/PhysRevB.68.100503
—	—	single_crystal	neutron	—	2003	T1	DOI: 10.1103/PhysRevLett.91.047002
—	—	thin_film	resistivity	—	2003	T1	cond-mat/0302017
—	—	polycrystal	—	—	2003	T2	cond-mat/0302202
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0302365
—	—	polycrystal	susceptibility	—	2003	T2	cond-mat/0302530
—	—	powder	susceptibility	—	2003	T2	cond-mat/0302620
—	ambient	wire	resistivity	—	2003	T1	cond-mat/0303043
—	—	thin_film	susceptibility	—	2003	T1	cond-mat/0303337
—	—	polycrystal	susceptibility	s-wave	2003	T2	cond-mat/0303446
—	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0304004
—	—	polycrystal	magnetization	—	2003	T1	cond-mat/0305027
—	—	polycrystal	susceptibility	—	2003	T1	cond-mat/0305523
—	—	single_crystal	resistivity	—	2003	T1	cond-mat/0305560
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0306013
—	—	wire	resistivity	—	2003	T1	cond-mat/0306090
—	—	thin_film	resistivity	—	2003	T1	cond-mat/0307143
—	—	polycrystal	resistivity, susceptibility	—	2003	T2	cond-mat/0308081
—	—	single_crystal	resistivity	—	2003	T1	cond-mat/0308152
—	—	single_crystal	resistivity	unknown	2003	T2	cond-mat/0309545
—	—	thin_film	resistivity	—	2003	T2	cond-mat/0310136
—	—	polycrystal	—	—	2003	T1	cond-mat/0310313
—	—	—	resistivity	—	2003	T1	cond-mat/0310379
—	—	thin_film	susceptibility	—	2003	T1	cond-mat/0311055
—	—	thin_film	resistivity	—	2003	T2	cond-mat/0311364
—	—	wire	resistivity, susceptibility	—	2003	T1	cond-mat/0302249
—	—	thin_film	resistivity	—	2003	T1	cond-mat/0304478
—	—	—	susceptibility	—	2003	T2	cond-mat/0305048
—	—	single_crystal	susceptibility	—	2003	T1	cond-mat/0305255
—	—	thin_film	resistivity, susceptibility	—	2003	T2	cond-mat/0306652
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0303283
—	—	—	ARPES	unknown	2003	T1	cond-mat/0303636
—	—	—	—	—	2003	T1	cond-mat/0303640
—	—	thin_film	resistivity	—	2003	T1	cond-mat/0305474
—	—	thin_film	resistivity	—	2003	T1	cond-mat/0307013
—	—	polycrystal	resistivity	—	2003	T1	cond-mat/0308265
—	—	single_crystal	resistivity	—	2002	T3	cond-mat/0201451
—	—	thin_film	resistivity	—	2002	T3	cond-mat/0203246
—	—	—	resistivity	—	2002	T3	cond-mat/0212361
—	—	—	susceptibility	—	2002	T1	cond-mat/0210317
—	—	single_crystal	STM	s-wave	2002	T1	DOI: 10.1103/PhysRevLett.89.187003
—	—	thin_film	resistivity, susceptibility, STM	—	2002	T1	cond-mat/0201022
—	—	wire	magnetization	—	2002	T1	cond-mat/0201261
—	—	—	—	—	2002	T1	cond-mat/0202031
—	—	thin_film	resistivity	—	2002	T1	cond-mat/0203113
—	—	single_crystal	susceptibility, resistivity, specific_heat	—	2002	T1	cond-mat/0203337
—	—	single_crystal	resistivity	—	2002	T2	cond-mat/0204027
—	—	single_crystal	—	—	2002	T1	cond-mat/0205036
—	—	—	neutron	—	2002	T2	cond-mat/0205486
—	ambient	single_crystal	susceptibility	—	2002	T2	cond-mat/0205561
—	—	single_crystal	—	—	2002	T2	cond-mat/0206231
—	—	—	resistivity	—	2002	T2	cond-mat/0206391
—	—	polycrystal	susceptibility, resistivity	—	2002	T1	cond-mat/0206409
—	—	polycrystal	resistivity, susceptibility	—	2002	T1	cond-mat/0206513
—	—	single_crystal	specific_heat	s-wave	2002	T2	cond-mat/0207141
—	—	—	—	—	2002	T2	cond-mat/0207146
—	—	single_crystal	STM	s-wave	2002	T2	cond-mat/0207394
—	—	polycrystal	susceptibility	—	2002	T1	cond-mat/0207580
—	ambient	single_crystal	susceptibility	—	2002	T1	cond-mat/0207658
—	—	polycrystal	susceptibility	—	2002	T1	cond-mat/0208043
—	—	polycrystal	resistivity, susceptibility	—	2002	T1	cond-mat/0208054
—	—	single_crystal	STM	—	2002	T1	cond-mat/0208060
—	—	powder	resistivity	—	2002	T1	cond-mat/0210178
—	—	—	—	—	2002	T2	cond-mat/0211544
—	—	polycrystal	STM	—	2002	T1	cond-mat/0212194
—	—	polycrystal	—	—	2002	T1	cond-mat/0212543
—	ambient	thin_film	—	—	2002	T1	cond-mat/0212599
—	—	—	susceptibility, resistivity	—	2002	T2	cond-mat/0207033
—	—	—	—	—	2002	T3	cond-mat/0201452
—	—	single_crystal	—	—	2002	T3	cond-mat/0201517
—	—	—	—	s-wave	2002	T1	cond-mat/0201578
—	—	polycrystal	susceptibility	—	2002	T2	cond-mat/0202415
—	—	wire	resistivity	—	2002	T1	cond-mat/0203114
—	—	polycrystal	resistivity	—	2002	T1	cond-mat/0203551
—	—	single_crystal	susceptibility	—	2002	T2	cond-mat/0205010
—	—	—	—	—	2002	T1	cond-mat/0207161
—	—	single_crystal	susceptibility	—	2002	T1	cond-mat/0203123
—	—	wire	resistivity	—	2002	T1	cond-mat/0207488
—	—	polycrystal	resistivity	—	2002	T1	cond-mat/0208133
—	—	thin_film	STM	—	2002	T1	cond-mat/0208571
—	—	—	—	—	2002	T2	cond-mat/0212443
—	—	—	susceptibility	—	2001	T3	cond-mat/0103350
—	ambient	wire	resistivity	—	2001	T3	cond-mat/0104236
—	—	—	—	s-wave	2001	T2	cond-mat/0105507
—	ambient	wire	resistivity	—	2001	T2	cond-mat/0102413
—	—	wire	resistivity	—	2001	T3	cond-mat/0108458
—	9.0	—	susceptibility	—	2001	T3	cond-mat/0105475
—	39.0	polycrystal	resistivity	—	2001	T1	DOI: 10.1103/PhysRevB.64.172502
—	—	—	—	—	2001	T3	cond-mat/0103536
—	—	polycrystal	resistivity	—	2001	T3	cond-mat/0102441
—	—	powder	susceptibility	—	2001	T3	cond-mat/0112301
—	—	polycrystal	susceptibility, resistivity	—	2001	T1	cond-mat/0104395
—	—	thin_film	susceptibility	—	2001	T1	cond-mat/0104501
—	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0104565
—	—	polycrystal	specific_heat	unknown	2001	T1	cond-mat/0104574
—	—	thin_film	susceptibility	—	2001	T2	cond-mat/0105080
—	—	polycrystal	resistivity	—	2001	T1	cond-mat/0106002
—	—	wire	magnetisation	—	2001	T1	cond-mat/0106148
—	—	—	—	—	2001	T1	cond-mat/0106258
—	—	powder	resistivity	—	2001	T2	cond-mat/0106585
—	ambient	—	specific_heat	—	2001	T1	cond-mat/0107072
—	—	single_crystal	—	s-wave	2001	T2	cond-mat/0107216
—	—	—	—	s-wave	2001	T2	cond-mat/0102115
—	—	polycrystal	muSR	s-wave	2001	T2	cond-mat/0102334
—	—	polycrystal	ARPES	s-wave	2001	T1	cond-mat/0103079
—	—	—	—	—	2001	T2	cond-mat/0103154
—	—	—	—	—	2001	T2	cond-mat/0103319
—	—	polycrystal	resistivity, susceptibility	—	2001	T1	cond-mat/0103408
—	—	powder	resistivity	—	2001	T2	cond-mat/0103587
—	—	thin_film	resistivity	—	2001	T1	cond-mat/0104562
—	—	—	—	—	2001	T3	cond-mat/0111260
—	—	wire	—	—	2001	T3	cond-mat/0106388
—	ambient	wire	resistivity	—	2001	T1	cond-mat/0106226
—	—	polycrystal	resistivity	—	2001	T1	cond-mat/0106341
—	—	powder	susceptibility	—	2001	T2	cond-mat/0106577
—	—	polycrystal	susceptibility	—	2001	T1	cond-mat/0107532
—	—	—	susceptibility	—	2001	T1	cond-mat/0108071
—	—	thin_film	susceptibility, resistivity	—	2001	T1	cond-mat/0108294
—	—	polycrystal	susceptibility, resistivity	—	2001	T1	cond-mat/0102517
—	—	wire	resistivity, susceptibility	—	2001	T3	cond-mat/0109085
—	—	—	resistivity	s-wave	2001	T1	cond-mat/0103512
—	—	polycrystal	resistivity	—	2001	T1	cond-mat/0103563
—	—	—	—	—	2001	T2	cond-mat/0103570
—	ambient	—	resistivity	—	2001	T2	cond-mat/0104041
—	—	thin_film	—	—	2001	T1	cond-mat/0104113
—	2.0	—	—	—	2001	T3	cond-mat/0109216
—	—	wire	resistivity	—	2001	T3	cond-mat/0109283
—	—	—	—	s-wave	2001	T3	cond-mat/0109347
—	—	thin_film	resistivity	—	2001	T3	cond-mat/0109536
—	—	polycrystal	susceptibility	s-wave	2001	T3	cond-mat/0110109
—	—	polycrystal	susceptibility	—	2001	T3	cond-mat/0110640
—	—	single_crystal	resistivity, specific_heat	—	2001	T3	cond-mat/0111273
—	ambient	polycrystal	—	—	2001	T3	cond-mat/0111585
—	—	single_crystal	thermal_conductivity	—	2001	T3	cond-mat/0112191
—	—	thin_film	resistivity	s-wave	2001	T3	cond-mat/0112350
—	—	single_crystal	—	—	2001	T3	cond-mat/0112392
—	—	polycrystal	muSR	—	2001	T1	cond-mat/0108431
—	—	polycrystal	—	s-wave	2001	T1	cond-mat/0104005

Structure

Crystal structure: AlB2-type structure
Space group: P6/mmm
Lattice c (Å): 3.517

Superconducting parameters

Pairing symmetry: s-wave
Gap structure: multi_gap
Hc2: 65.4 T (T=0, H perpendicular c)
λ_eph (e–ph coupling): 0.87
ω_log: 1508 K

Competing orders

ρ(T) exponent: 2.45

Samples & pressure

Substrate: sapphire
Pressure type: none
Doping type: none
Doping level: 0.025