Tc max
5.6 K
Tc ambient
5.6 K
arXiv year
2019
Papers
8
Tc exp.
5.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, resistivity, DOI: 10.1103/blwl-l16s, confirmed by 2 papers
Evidence (18 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.3 | 11.8 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 5.6 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 5.6 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevLett.133.226001 |
| 5.1 | 6.2 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 5.0 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.220510 |
| 5.0 | — | thin_film | resistivity | — | 2019 | T1 | 1905.08641 |
| 4.0 | 2.3 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 4.0 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.L121108 |
| 4.0 | — | thin_film | resistivity | — | 2023 | T1 | 2301.07299 |
| 3.5 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.220510 |
| 3.0 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 3.0 | — | thin_film | resistivity, susceptibility | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.220510 |
| 3.0 | — | thin_film | resistivity | — | 2019 | T1 | 1905.08641 |
| 2.9 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevLett.133.226001 |
| 2.6 | — | thin_film | resistivity | — | 2022 | T1 | 2201.06400 |
| 2.6 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.214511 |
| 2.5 | 6.2 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 1.5 | 2.3 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
Structure
- Crystal structure
- spinel
- Space group
- Fd3m
- Lattice c (Å)
- 8.520
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgAl2O4