Tc max
5.6 K
Tc ambient
5.6 K
arXiv year
2019
Papers
8
Tc exp.
5.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, resistivity, DOI: 10.1103/blwl-l16s, confirmed by 2 papers
Evidence (18 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.3 | 11.8 | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 5.6 | ambient | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/blwl-l16s |
| 5.6 | — |
Structure
- Crystal structure
- spinel
- Space group
- Fd3m
- Lattice c (Å)
- 8.520
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgAl2O4