Tc max
24.9 K
Tc ambient
—
arXiv year
2020
Papers
1
Tc exp.
—
Tc theo.
24.9 K
Evidence
theoretical
Tc max measured at theoretical (DFT/computational), thin_film, DOI: 10.1103/PhysRevB.102.075431
Evidence (2 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 24.9 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.075431 |
| 2.9 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.075431 |
Structure
- Crystal structure
- P-3m1
- Space group
- P-3m1 (#164)
- Lattice a (Å)
- 3.820
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Si (111)