Tc max
0.9 K
Tc ambient
0.9 K
arXiv year
1986
Papers
10
Tc exp.
0.9 K
Tc theo.
—
Evidence
mixed
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevLett.57.238
Evidence (10 records from 10 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.9 | — | polycrystal | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.57.238 |
| 0.9 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0509318 |
| 0.6 |
Structure
- Crystal structure
- BCC
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.35
Samples & pressure
- Sample form
- thin_film
- Substrate
- Al2O3