Tc max
0.2 K
Tc ambient
—
arXiv year
2010
Papers
2
Tc exp.
0.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.104.047003
Overlayer
mo
Substrate
au
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.2 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.047003 |
| 0.2 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.184502 |
| 0.1 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film