Tc max
7.0 K
Tc ambient
7.0 K
arXiv year
2007
Papers
2
Tc exp.
7.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, susceptibility, arXiv:1603.03131
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.0 | — | thin_film | susceptibility | — | 2016 | T1 | 1603.03131 |
| — | — | thin_film | resistivity | — | 2007 | T1 | 0706.2047 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon
- Doping level
- 0.220