Tc max
7.4 K
Tc ambient
4.5 K
arXiv year
1987
Papers
2
Tc exp.
7.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1905.10753, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.4 | — | thin_film | resistivity | — | 2019 | T1 | 1905.10753 |
| 4.5 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevLett.59.2697 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si (100)