Tc max
5.0 K
Tc ambient
5.0 K
arXiv year
2016
Papers
2
Tc exp.
5.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1611.08238, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.0 | — | thin_film | resistivity | — | 2016 | T1 | 1611.08238 |
| 4.1 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.014516 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si/Si3N4