Tc max
7.9 K
Tc ambient
7.9 K
arXiv year
2008
Papers
13
Tc exp.
4.0 K
Tc theo.
12.0 K
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:2604.19525, confirmed by 2 papers
Evidence (14 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 13.0 | — | — | — | — | 2017 | T1 | 1702.03373 |
| 12.0 | — | thin_film | — | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.035140 |
| 8.0 | — |
Structure
- Crystal structure
- orthorhombic
- Space group
- Pbcn (No. 60)
- Lattice a (Å)
- 4.733
- Lattice c (Å)
- 5.205
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 0.2 T (0.4 K, perpendicular magnetic field)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- sapphire (0001)