Tc max
8.0 K
Tc ambient
8.0 K
arXiv year
2018
Papers
4
Tc exp.
8.0 K
Tc theo.
37.8 K
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:1801.02659, confirmed by 3 papers
Evidence (7 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 37.8 | — | — | — | — | 2022 | T1 | 2207.10863 |
| 35.4 | — | — | — | — | 2022 | T1 | 2207.10863 |
| 28.9 | — | — | — | — | 2022 | T1 | 2207.10863 |
| 22.7 | — | — | — | — | 2022 | T1 | 2207.10863 |
| 8.0 | — | thin_film | resistivity | — | 2018 | T1 | 1801.02659 |
| 7.4 | — | thin_film | resistivity | — | 2023 | T1 | 2310.18524 |
| 2.0 | — | thin_film | resistivity | — | 2023 | — | 2311.17506 |
Superconducting parameters
- λ_eph (e–ph coupling)
- 1.30
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si