Tc max
6.5 K
Tc ambient
6.5 K
arXiv year
2012
Papers
3
Tc exp.
6.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.92.024513
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.5 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.024513 |
| — | — | thin_film | resistivity | — | 2012 | T1 | 1202.0073 |
| — | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- single-wall carbon nanotube