Tc max
8.0 K
Tc ambient
8.0 K
arXiv year
1995
Papers
6
Tc exp.
7.9 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.75.4118, confirmed by 2 papers
Evidence (6 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 8.0 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevLett.75.4118 |
| 7.9 | — | thin_film | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.57.1206 |
| 7.8 |
Structure
- Crystal structure
- A15
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire