Tc max
1.1 K
Tc ambient
1.1 K
arXiv year
1996
Papers
7
Tc exp.
1.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.64.060504, confirmed by 4 papers
Evidence (13 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.1 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.64.060504 |
| 1.0 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.65.220505 |
| 1.0 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.64.060504 |
| 1.0 | — | thin_film | resistivity | — | 2001 | T3 | cond-mat/0111179 |
| 1.0 | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0006138 |
| 0.5 | — | thin_film | resistivity | — | 2001 | T3 | cond-mat/0111179 |
| 0.5 | — | thin_film | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.037002 |
| 0.5 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.65.220505 |
| 0.5 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.64.060504 |
| 0.5 | — | thin_film | resistivity | — | 2001 | T3 | cond-mat/0111179 |
| 0.5 | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0006138 |
| 0.5 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevLett.76.1529 |
| — | ambient | thin_film | susceptibility, resistivity | — | 2012 | T2 | 1212.1204 |
Superconducting parameters
- Hc2
- 1.9 T
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiN