Tc max
6.1 K
Tc ambient
6.1 K
arXiv year
1991
Papers
8
Tc exp.
6.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, specific_heat, DOI: 10.1103/PhysRevLett.69.2407, confirmed by 2 papers
Evidence (25 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.0 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 6.1 | — | thin_film | specific_heat | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.2407 |
| 5.4 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire