Tc max
6.1 K
Tc ambient
6.1 K
arXiv year
1991
Papers
8
Tc exp.
6.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, specific_heat, DOI: 10.1103/PhysRevLett.69.2407, confirmed by 2 papers
Evidence (25 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.0 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 6.1 | — | thin_film | specific_heat | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.2407 |
| 5.4 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 5.4 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.66.2826 |
| 5.4 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.4 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.6303 |
| 5.3 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.3 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.3 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.3 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.66.2826 |
| 5.2 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.2 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.7084 |
| 5.1 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.66.2826 |
| 5.0 | — | thin_film | susceptibility | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.174505 |
| 4.9 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 4.8 | — | thin_film | specific_heat | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.2407 |
| 4.5 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 4.0 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 3.9 | — | thin_film | susceptibility | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.174505 |
| 3.7 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| 3.2 | — | thin_film | susceptibility | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.174505 |
| 3.0 | — | thin_film | susceptibility | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.174505 |
| 3.0 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.84.987 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0007342 |
| — | — | thin_film | susceptibility | — | 1999 | T1 | cond-mat/9907033 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire