Tc max
3.4 K
Tc ambient
—
arXiv year
2012
Papers
6
Tc exp.
3.4 K
Tc theo.
—
Evidence
experimental
Tc max measured at wire, resistivity, DOI: 10.1103/PhysRevLett.109.027002, confirmed by 2 papers
Evidence (17 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.7 | — | thin_film | STM | — | 2017 | T1 | 1704.06052 |
| 6.6 | — | thin_film | STM | — | 2017 | T1 | 1704.06052 |
| 3.4 | — | wire | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.027002 |
| 3.2 | — | wire | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.027002 |
| 3.0 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 2.8 | — | thin_film | resistivity | — | 2023 | T3 | 2309.00747 |
| 2.7 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 1.9 | — | thin_film | STM | — | 2017 | T1 | 1704.06052 |
| 1.8 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 1.5 | — | wire | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.235164 |
| 1.1 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 1.0 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 0.9 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 0.8 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 0.6 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| 0.3 | — | thin_film | resistivity | — | 2012 | T1 | 1204.3333 |
| — | — | thin_film | resistivity | — | 2022 | T1 | 2211.08050 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicate glass