Tc max
6.9 K
Tc ambient
6.9 K
arXiv year
1989
Papers
13
Tc exp.
6.9 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.70.670, confirmed by 2 papers
Evidence (46 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.1 | — | thin_film | magnetization | — | 2013 | T1 | 1301.6283 |
| 6.9 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevLett.70.670 |
| 6.7 | — | thin_film | magnetization | — | 2013 | T1 | 1301.6283 |
| 6.7 | — | thin_film | — | — | 2014 | T1 | DOI: 10.1103/PhysRevB.89.134508 |
| 6.7 | — | thin_film | magnetization | — | 2013 | T1 | 1301.6283 |
| 6.5 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevLett.70.670 |
| 6.2 | — | thin_film | — | — | 2014 | T1 | DOI: 10.1103/PhysRevB.89.134508 |
| 5.9 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 5.9 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.220506 |
| 5.6 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevLett.70.670 |
| 5.6 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevLett.70.670 |
| 5.6 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 5.6 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.220506 |
| 5.5 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 5.5 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 5.4 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 5.4 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 5.2 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 5.2 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.220506 |
| 5.2 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 5.2 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 5.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.054519 |
| 4.9 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 4.9 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 4.8 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 4.8 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 4.8 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| 4.8 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 4.8 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 4.4 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.054514 |
| 4.4 | — | wire | resistivity | — | 2004 | T1 | cond-mat/0411749 |
| 4.0 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.63.672 |
| 3.9 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 3.9 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 3.9 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.214506 |
| 3.9 | — | thin_film | resistivity | — | 2003 | T2 | cond-mat/0312268 |
| 3.9 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| 3.8 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| 3.8 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| 3.0 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 2.5 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 2.5 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 2.3 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| 1.9 | — | thin_film | resistivity | — | 2007 | T1 | 0709.4180 |
| 1.7 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0508300 |
| — | — | wire | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.017004 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiN membrane