Tc max
8.5 K
Tc ambient
8.3 K
arXiv year
1990
Papers
12
Tc exp.
8.5 K
Tc theo.
21.1 K
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:1601.05759, confirmed by 2 papers
Evidence (37 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 21.1 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 15.7 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 14.0 | — | — |
Structure
- Crystal structure
- rocksalt
- Space group
- Fm3̅m (#225)
- Lattice a (Å)
- 2.898
- Lattice c (Å)
- 2.809
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si
- Doping type
- hole
- Doping level
- 0.600