Tc max
8.5 K
Tc ambient
8.3 K
arXiv year
1990
Papers
12
Tc exp.
8.5 K
Tc theo.
21.1 K
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:1601.05759, confirmed by 2 papers
Evidence (37 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 21.1 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 15.7 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 14.0 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 10.4 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 9.0 | — | — | — | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.054205 |
| 9.0 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 8.6 | — | — | — | — | 2017 | T1 | 1709.08143 |
| 8.5 | — | thin_film | STM | — | 2016 | T1 | 1601.05759 |
| 8.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 8.3 | — | thin_film | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.3078 |
| 8.3 | — | thin_film | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.3078 |
| 8.0 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.224506 |
| 8.0 | — | thin_film | resistivity | — | 2014 | T1 | 1407.2402 |
| 7.9 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 7.3 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 7.0 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 7.0 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 6.7 | — | thin_film | resistivity, STM | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 6.7 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.224506 |
| 6.7 | — | thin_film | resistivity | — | 2014 | T1 | 1407.2402 |
| 5.8 | — | thin_film | resistivity, STM | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.224506 |
| 5.8 | — | thin_film | resistivity | — | 2014 | T1 | 1407.2402 |
| 5.1 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 4.8 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 4.0 | — | thin_film | STM, resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.102.180508 |
| 3.8 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 3.7 | — | thin_film | STM | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 2.5 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 2.4 | — | thin_film | resistivity | — | 2021 | T1 | 2102.13483 |
| 1.7 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.3238 |
| 1.3 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.224506 |
| 1.3 | — | thin_film | resistivity | — | 2014 | T1 | 1407.2402 |
| 1.2 | — | thin_film | STM | — | 2016 | T1 | 1601.05759 |
| 1.2 | — | thin_film | resistivity, STM | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.014505 |
| 0.4 | — | — | — | — | 2017 | T1 | 1709.08143 |
| — | — | thin_film | STM, resistivity | — | 2020 | T1 | 2011.04329 |
| — | — | thin_film | — | — | 2018 | T1 | 1809.00849 |
Structure
- Crystal structure
- rocksalt
- Space group
- Fm3̅m (#225)
- Lattice a (Å)
- 2.898
- Lattice c (Å)
- 2.809
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire
- Doping type
- hole
- Doping level
- 0.600