Tc max
0.1 K
Tc ambient
—
arXiv year
2011
Papers
3
Tc exp.
0.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1212.3537, confirmed by 2 papers
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.1 | — | thin_film | resistivity | — | 2012 | — | 1212.3537 |
| 0.1 | — | — | — | — | 2020 | T1 | 2012.11680 |
| — | — | thin_film | resistivity | — | 2011 | T3 | 1110.1608 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon-nitride membrane