Tc max
6.7 K
Tc ambient
6.7 K
arXiv year
1986
Papers
49
Tc exp.
6.7 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, susceptibility, arXiv:1109.2532, confirmed by 2 papers
Evidence (73 records from 49 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.9 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.014509 |
| 6.7 | ambient | thin_film | susceptibility | — | 2011 | T1 | 1109.2532 |
| 6.7 | ambient | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevB.55.15183 |
| 6.5 | — | thin_film | susceptibility | — | 2002 | T1 | DOI: 10.1103/PhysRevB.66.054529 |
| 6.5 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.64.014503 |
| 6.3 | — | thin_film | resistivity | — | 2018 | T1 | 1810.08198 |
| 6.3 | — | thin_film | — | — | 2007 | T1 | cond-mat/0702106 |
| 6.2 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.077001 |
| 6.2 | — | thin_film | resistivity | — | 2020 | T1 | 2007.01110 |
| 6.2 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.180506 |
| 6.1 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.014509 |
| 6.1 | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.56.173 |
| 6.0 | — | thin_film | — | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.014501 |
| 5.9 | — | thin_film | — | — | 2023 | T1 | 2305.01766 |
| 5.7 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.052503 |
| 5.7 | — | thin_film | — | — | 2007 | T1 | cond-mat/0702106 |
| 5.6 | — | thin_film | resistivity | — | 2014 | T1 | 1403.6856 |
| 5.6 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.134516 |
| 5.6 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.064502 |
| 5.5 | — | thin_film | susceptibility | — | 2014 | T1 | 1403.6856 |
| 5.5 | — | thin_film | susceptibility | — | 2014 | T1 | 1403.6856 |
| 5.5 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.86.024521 |
| 5.4 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.064502 |
| 5.4 | — | polycrystal | susceptibility | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.6796 |
| 5.3 | — | thin_film | resistivity | — | 2014 | T1 | 1403.6856 |
| 5.3 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.134516 |
| 5.1 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.067001 |
| 5.0 | — | polycrystal | susceptibility | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.6796 |
| 5.0 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.064502 |
| 5.0 | — | thin_film | susceptibility | — | 2014 | T1 | 1403.6856 |
| 5.0 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.064502 |
| 5.0 | — | polycrystal | susceptibility | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.6796 |
| 5.0 | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.56.173 |
| 4.9 | — | thin_film | resistivity | — | 2014 | T1 | 1403.6856 |
| 4.9 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.134516 |
| 4.9 | — | polycrystal | susceptibility | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.6796 |
| 4.7 | — | polycrystal | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.174513 |
| 4.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.014509 |
| 4.4 | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.56.173 |
| 4.3 | — | polycrystal | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.174513 |
| 4.0 | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevLett.56.173 |
| 3.6 | — | thin_film | resistivity | — | 2014 | T1 | 1403.6856 |
| 3.6 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.134516 |
| 3.5 | — | thin_film | susceptibility | — | 2014 | T1 | 1403.6856 |
| 3.0 | — | polycrystal | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.174513 |
| 2.2 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.214520 |
| 1.4 | — | thin_film | resistivity | — | 2021 | T1 | 2110.09335 |
| 0.5 | — | thin_film | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevLett.82.5341 |
| 0.5 | — | thin_film | resistivity | — | 1998 | T1 | cond-mat/9810228 |
| — | — | thin_film | susceptibility | — | 2025 | — | 2503.10131 |
| — | — | thin_film | resistivity | — | 2024 | — | 2412.17576 |
| — | — | thin_film | susceptibility | — | 2024 | T3 | 2402.00387 |
| — | — | thin_film | resistivity | — | 2023 | T1 | 2312.10805 |
| — | — | thin_film | resistivity | — | 2022 | T3 | 2210.05388 |
| — | — | thin_film | susceptibility | — | 2022 | T1 | 2211.04276 |
| — | — | thin_film | resistivity | — | 2021 | — | 2103.00615 |
| — | — | thin_film | STM | s-wave | 2021 | T1 | 2102.12996 |
| — | — | thin_film | resistivity | — | 2020 | — | 1909.06573 |
| — | — | thin_film | — | — | 2020 | — | 2003.07946 |
| — | — | wire | resistivity | — | 2020 | T3 | 2003.13157 |
| — | — | thin_film | — | s-wave | 2020 | T1 | DOI: 10.1103/PhysRevB.102.060501 |
| — | — | thin_film | STM, susceptibility, resistivity | — | 2020 | T2 | 2012.00709 |
| — | — | thin_film | STM, susceptibility, resistivity | — | 2020 | T1 | 2003.12398 |
| — | — | thin_film | resistivity, STM | — | 2019 | T3 | 1905.01045 |
| — | — | thin_film | resistivity | — | 2018 | T1 | 1805.05193 |
| — | — | thin_film | resistivity | — | 2015 | T1 | 1512.05231 |
| — | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevX.5.021019 |
| — | — | thin_film | — | — | 2014 | T3 | 1406.5128 |
| — | — | thin_film | resistivity | — | 2014 | T1 | 1410.4973 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.220501 |
| — | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.83.184503 |
| — | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.92.237001 |
| — | — | wire | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevB.68.134515 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- Pairing symmetry
- s-wave
- Hc2
- 12.5 T (0.05 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- CrO2
- Pressure type
- none
- Doping type
- none