Tc max
11.5 K
Tc ambient
9.9 K
arXiv year
2006
Papers
13
Tc exp.
11.5 K
Tc theo.
36.6 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1312.6144, confirmed by 2 papers
Evidence (29 records from 13 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 36.6 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 32.1 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 29.0 | — | — | — | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.052504 |
| 26.7 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 23.7 | ambient | — | — | — | 2025 | — | 2503.10943 |
| 13.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.212503 |
| 13.1 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.212503 |
| 11.5 | — | thin_film | resistivity | — | 2013 | T1 | 1312.6144 |
| 11.3 | — | thin_film | STM | s-wave | 2013 | T1 | 1312.6144 |
| 9.9 | — | thin_film | resistivity | — | 2016 | T1 | 1607.05416 |
| 9.9 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.064506 |
| 8.3 | — | thin_film | resistivity | — | 2016 | T1 | 1607.05416 |
| 8.3 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.064506 |
| 8.2 | — | thin_film | — | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.174521 |
| 7.9 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.094517 |
| 7.8 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.174507 |
| 7.5 | — | thin_film | resistivity | — | 2016 | T1 | 1607.05416 |
| 7.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.064506 |
| 5.8 | ambient | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.184511 |
| 5.6 | ambient | thin_film | STM | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.184511 |
| 4.2 | — | thin_film | resistivity | — | 2016 | T1 | 1607.05416 |
| 4.2 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.064506 |
| 2.9 | ambient | thin_film | STM | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.184511 |
| 2.8 | ambient | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.184511 |
| 2.8 | — | thin_film | resistivity | — | 2016 | T1 | 1607.05416 |
| 2.8 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.064506 |
| — | — | thin_film | resistivity, STM | — | 2023 | — | 2311.17501 |
| — | — | — | — | — | 2022 | T3 | 2205.00060 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2105.06780 |
Structure
- Crystal structure
- cubic
- Space group
- 187
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon
- Pressure type
- none
- Doping type
- none