Tc max
11.5 K
Tc ambient
7.6 K
arXiv year
2014
Papers
37
Tc exp.
11.5 K
Tc theo.
16.0 K
Evidence
mixed
Tc max measured at P=90 GPa, arXiv:1503.05331, confirmed by 2 papers
Evidence (47 records from 37 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 17.0 | — | thin_film | — | — | 2016 | T1 | DOI: 10.1103/PhysRevB.94.024501 |
| 16.0 | 150.0 | — | — | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.144113 |
| 12.0 | 200.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 12.0 | 220.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 11.6 | — | — | — | f-wave | 2015 | — | 1504.04536 |
| 11.5 | 90.0 | — | — | — | 2015 | — | 1503.05331 |
| 11.0 | 125.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 10.0 | — | — | — | unknown | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.094001 |
| 10.0 | — | — | — | — | 2022 | T3 | 2204.08082 |
| 10.0 | 115.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 9.6 | — | single_crystal | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.023127 |
| 8.9 | — | — | — | — | 2025 | T2 | 2511.13268 |
| 7.6 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.074003 |
| 7.3 | — | single_crystal | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.023127 |
| 6.0 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.074003 |
| 5.3 | — | — | — | — | 2018 | T1 | 1809.09298 |
| 5.3 | — | single_crystal | resistivity, susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.184513 |
| 5.0 | 100.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 4.6 | — | — | — | — | 2015 | T1 | 1512.03264 |
| 4.2 | — | — | — | — | 2018 | T1 | 1809.09298 |
| 4.2 | — | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.184513 |
| 4.0 | — | single_crystal | — | — | 2017 | T1 | 1712.09248 |
| 3.0 | 90.0 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.037002 |
| 2.8 | — | — | — | — | 2015 | T1 | 1512.03264 |
| — | — | — | — | — | 2026 | T3 | 2603.28920 |
| — | — | polycrystal | resistivity | — | 2025 | T1 | 2509.03031 |
| — | — | — | resistivity | — | 2025 | T1 | 2512.20207 |
| — | — | thin_film | resistivity | — | 2024 | — | 2402.17328 |
| — | — | — | — | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.064310 |
| — | — | — | susceptibility | unknown | 2022 | T3 | 2209.11800 |
| — | — | — | — | — | 2022 | T1 | 2212.08117 |
| — | — | thin_film | — | — | 2022 | T1 | 2209.01973 |
| — | — | — | — | — | 2021 | — | 2104.03872 |
| — | — | — | — | — | 2021 | T3 | 2108.01121 |
| — | — | thin_film | resistivity | — | 2020 | T1 | 2006.10749 |
| — | — | thin_film | resistivity | — | 2019 | T3 | 1902.09358 |
| — | — | thin_film | — | s-wave | 2019 | T3 | 1903.04830 |
| — | — | thin_film | resistivity | — | 2019 | T3 | 1904.00611 |
| — | — | thin_film | resistivity | — | 2018 | — | 1804.07218 |
| — | — | — | STM | — | 2018 | — | 1806.03222 |
| — | — | thin_film | — | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.064509 |
| — | — | — | resistivity | — | 2018 | T1 | 1802.06675 |
| — | — | thin_film | resistivity | — | 2017 | T3 | 1704.07618 |
| — | — | thin_film | — | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.094510 |
| — | — | thin_film | — | — | 2015 | T1 | 1506.04146 |
| — | — | thin_film | — | — | 2015 | T1 | 1512.03222 |
| — | — | — | — | — | 2014 | T1 | 1404.4295 |
Structure
- Crystal structure
- P4/mmm
- Space group
- P4/mmm
- Lattice a (Å)
- 3.190
- Lattice c (Å)
- 5.945
Superconducting parameters
- Gap structure
- nodal
- Hc2
- 52.0 T (0 K, GL fit)
- λ_eph (e–ph coupling)
- 1.67
Competing orders
- ρ(T) exponent
- 3.00
Samples & pressure
- Substrate
- Li ion conductor
- Pressure type
- hydrostatic
- Doping level
- 0.020