Tc max
7.3 K
Tc ambient
7.3 K
arXiv year
2013
Papers
18
Tc exp.
7.3 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:2603.05176, confirmed by 2 papers
Evidence (23 records from 18 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.3 | — | thin_film | susceptibility | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.104510 |
| 7.3 | — | — | resistivity | — | 2026 | T1 | 2603.05176 |
| 6.8 | — |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si