Tc max
7.3 K
Tc ambient
7.3 K
arXiv year
2013
Papers
18
Tc exp.
7.3 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:2603.05176, confirmed by 2 papers
Evidence (23 records from 18 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 7.3 | — | thin_film | susceptibility | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.104510 |
| 7.3 | — | — | resistivity | — | 2026 | T1 | 2603.05176 |
| 6.8 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.060508 |
| 6.4 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.19.034098 |
| 5.7 | — | thin_film | — | — | 2023 | T1 | 2303.11202 |
| 5.5 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.18.014006 |
| 5.4 | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevApplied.18.014006 |
| 5.2 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.060508 |
| 5.0 | — | thin_film | susceptibility | — | 2021 | T1 | 2110.09093 |
| 4.6 | — | thin_film | resistivity | — | 2013 | T1 | 1309.7074 |
| 4.2 | — | thin_film | — | — | 2017 | T1 | 1708.04231 |
| 3.4 | — | thin_film | resistivity | — | 2017 | T1 | 1708.06629 |
| 2.8 | — | thin_film | resistivity | — | 2017 | T1 | 1708.06629 |
| 2.6 | — | thin_film | resistivity | — | 2017 | T1 | 1708.06629 |
| 2.5 | — | thin_film | resistivity | — | 2017 | T1 | 1708.06629 |
| — | — | thin_film | — | — | 2023 | T1 | DOI: 10.1103/PhysRevApplied.19.064041 |
| — | ambient | thin_film | resistivity | — | 2022 | T1 | 2204.06467 |
| — | — | thin_film | susceptibility | — | 2022 | T1 | DOI: 10.1103/PhysRevB.106.144510 |
| — | — | thin_film | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.214507 |
| — | — | thin_film | resistivity | — | 2021 | — | 2107.01046 |
| — | — | thin_film | resistivity | — | 2020 | — | 1909.02915 |
| — | — | thin_film | susceptibility | — | 2019 | T1 | 1907.05110 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1910.02491 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si