Tc max
7.6 K
Tc ambient
7.0 K
arXiv year
2015
Papers
49
Tc exp.
7.6 K
Tc theo.
10.0 K
Evidence
experimental
Tc max measured at resistivity, arXiv:1905.06508, confirmed by 2 papers
Evidence (78 records from 49 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 10.0 | — | — | — | unknown | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.094001 |
| 10.0 | — | — | — | — | 2022 | T3 | 2204.08082 |
| 8.2 | 11.7 | — | resistivity | — | 2015 | T1 | 1508.03502 |
| 7.6 | — | — | resistivity | — | 2019 | — | 1905.06508 |
| 7.5 | — | thin_film | — | unknown | 2023 | T1 | 2302.14274 |
| 7.0 | — | — | — | — | 2019 | T1 | 1911.02228 |
| 6.0 | — | thin_film | STM | — | 2025 | T1 | DOI: 10.1103/x6k9-wgk9 |
| 5.0 | — | — | resistivity | — | 2019 | — | 1905.06508 |
| 5.0 | ambient | — | resistivity | unknown | 2018 | T1 | 1805.02470 |
| 3.8 | 2.2 | — | susceptibility | — | 2026 | T2 | 2601.21354 |
| 3.5 | 1.2 | single_crystal | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144506 |
| 3.0 | 31.3 | single_crystal | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.104511 |
| 3.0 | 1.4 | — | susceptibility | — | 2026 | T2 | 2601.21354 |
| 2.5 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevLett.133.216002 |
| 2.5 | — | — | resistivity | — | 2019 | — | 1905.06508 |
| 2.2 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 2.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevResearch.6.013132 |
| 2.2 | — | thin_film | resistivity | — | 2023 | T1 | 2303.09747 |
| 1.9 | 0.7 | — | susceptibility | — | 2026 | T2 | 2601.21354 |
| 1.7 | ambient | — | — | s-wave | 2021 | T1 | 2109.04931 |
| 1.6 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 1.6 | ambient | — | — | s-wave | 2021 | T1 | 2109.04931 |
| 1.5 | — | — | — | p-wave | 2025 | — | 2504.07082 |
| 1.4 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 1.2 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.8 | — | — | resistivity | unknown | 2022 | T2 | 2208.00933 |
| 0.8 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.8 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevResearch.6.013132 |
| 0.8 | — | thin_film | resistivity | — | 2023 | T1 | 2303.09747 |
| 0.5 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.5 | — | single_crystal | resistivity | — | 2023 | T3 | 2302.02610 |
| 0.5 | ambient | single_crystal | resistivity | s-wave | 2023 | T1 | DOI: 10.1103/PhysRevMaterials.7.L111801 |
| 0.5 | — | — | resistivity | — | 2019 | — | 1905.06508 |
| 0.4 | ambient | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.074202 |
| 0.3 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.3 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.3 | — | — | — | — | 2019 | T1 | 1911.02228 |
| 0.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.174509 |
| 0.2 | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.174509 |
| 0.2 | — | single_crystal | resistivity | s_pm | 2020 | T1 | DOI: 10.1103/PhysRevB.102.064502 |
| 0.1 | — | single_crystal | resistivity | — | 2026 | T1 | DOI: 10.1103/wz8l-nv8c |
| 0.1 | — | — | — | d-wave | 2025 | — | 2504.07082 |
| 0.1 | ambient | — | resistivity | — | 2023 | — | 2309.00261 |
| 0.1 | ambient | single_crystal | resistivity | — | 2023 | T3 | 2302.02610 |
| 0.1 | ambient | single_crystal | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevMaterials.7.084802 |
| 0.1 | ambient | — | — | s-wave | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214515 |
| 0.1 | — | single_crystal | resistivity | s_pm | 2020 | T1 | DOI: 10.1103/PhysRevB.102.064502 |
| 0.1 | ambient | single_crystal | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.100501 |
| 0.1 | — | single_crystal | resistivity | — | 2016 | T1 | 1602.01549 |
| 0.1 | — | single_crystal | resistivity, susceptibility | — | 2015 | T1 | 1512.08175 |
| 0.1 | — | — | resistivity | — | 2015 | T1 | 1508.03502 |
| 0.1 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.174509 |
| — | — | thin_film | resistivity | s-wave | 2026 | T2 | 2603.04978 |
| — | — | — | — | p-wave | 2025 | T3 | 2506.12767 |
| — | — | thin_film | susceptibility | — | 2025 | T2 | 2512.24671 |
| — | — | — | — | s-wave | 2025 | T2 | 2509.23904 |
| — | 0.7 | single_crystal | — | s-wave | 2024 | T1 | 2406.07260 |
| — | 1.2 | single_crystal | — | s-wave | 2024 | T1 | 2406.07260 |
| — | 2.2 | single_crystal | — | s-wave | 2024 | T1 | 2406.07260 |
| — | — | thin_film | — | — | 2024 | — | 2409.04594 |
| — | — | — | resistivity | — | 2024 | T3 | 2402.14534 |
| — | — | thin_film | resistivity | — | 2024 | T1 | 2409.09308 |
| — | — | thin_film | STM | unknown | 2024 | T3 | 2411.11040 |
| — | — | — | — | — | 2023 | — | 2304.05443 |
| — | ambient | thin_film | resistivity | — | 2023 | T1 | 2303.09052 |
| — | — | single_crystal | resistivity | s_pm | 2023 | T3 | 2311.07136 |
| — | — | — | resistivity | — | 2019 | T1 | 1903.05388 |
| — | 1.5 | — | resistivity | — | 2019 | T1 | 1903.05388 |
| — | — | thin_film | resistivity | — | 2019 | T2 | 1911.08598 |
| — | — | thin_film | resistivity | s_pm | 2019 | T3 | 1907.03521 |
| — | ambient | — | resistivity | — | 2018 | T1 | 1807.11668 |
| — | — | — | resistivity | — | 2018 | — | 1801.06955 |
| — | 0.8 | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevMaterials.2.074202 |
| — | ambient | — | muSR | s-wave | 2017 | T1 | 1704.05185 |
| — | 1.3 | — | muSR | s-wave | 2017 | T1 | 1704.05185 |
| — | — | — | specific_heat | — | 2017 | T1 | 1703.02696 |
| — | — | single_crystal | resistivity | unknown | 2016 | T1 | 1605.09065 |
Structure
- Crystal structure
- orthorhombic Td phase
- Space group
- Pnm21
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- multi_gap
- Hc2
- 28.9 T (0 K, H perpendicular to ab plane)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- hBN
- Doping type
- hole
- Doping level
- 0.010