Tc max
3.9 K
Tc ambient
3.3 K
arXiv year
1998
Papers
3
Tc exp.
3.9 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.74.144509
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.9 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.144509 |
| 3.3 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.224521 |
| 3.3 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass