Tc max
4.2 K
Tc ambient
—
arXiv year
1991
Papers
11
Tc exp.
4.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.70.092502
Overlayer
nb/alox
Substrate
nb
Evidence (11 records from 11 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.2 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.092502 |
| — | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.174506 |
| — | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.101.157001 |
| — | — | thin_film | resistivity | — | 2003 | T1 | DOI: 10.1103/PhysRevB.68.060504 |
| — | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.65.180503 |
| — | — | thin_film | — | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.14518 |
| — | — | polycrystal | — | — | 1997 | T1 | DOI: 10.1103/PhysRevB.56.5564 |
| — | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.53.R11949 |
| — | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.14948 |
| — | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.51.435 |
| — | — | thin_film | — | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.67.3034 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film