Tc max
9.0 K
Tc ambient
6.0 K
arXiv year
1987
Papers
7
Tc exp.
9.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.54.3508, confirmed by 2 papers
Overlayer
cu
Substrate
nb
Evidence (8 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 9.0 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.3508 |
| 9.0 | — | polycrystal | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.12969 |
| 6.0 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire