Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2006
Papers
1
Tc max measured at thin_film, resistivity, arXiv:cond-mat/0602448
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.0 | — | thin_film | resistivity | — | 2006 | — | cond-mat/0602448 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- silicon
- Pressure type
- none