Nb_0.15Si_0.85

conventional

ambient SCdisputed

Tc max

0.5 K

Tc ambient

0.5 K

arXiv year

2006

Papers

Tc exp.

0.5 K

Tc theo.

—

Evidence

experimental

Tc max measured at ambient, thin_film, resistivity, DOI: 10.1103/PhysRevB.78.144520, confirmed by 2 papers

Evidence (17 records from 7 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
0.5	ambient	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.78.144520
0.5	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.5	ambient	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.78.144520
0.5	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.4	—	thin_film	resistivity	—	2007	T1	DOI: 10.1103/PhysRevB.76.214504
0.4	—	thin_film	—	—	2007	T1	cond-mat/0701376
0.4	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.3	ambient	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.78.144520
0.3	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.2	—	thin_film	resistivity	—	2006	T1	DOI: 10.1103/PhysRevB.73.094521
0.2	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.2	ambient	thin_film	resistivity	—	2008	T1	DOI: 10.1103/PhysRevB.78.144520
0.2	—	thin_film	resistivity	—	2006	T1	cond-mat/0601024
0.2	—	thin_film	resistivity	—	2007	T1	DOI: 10.1103/PhysRevB.76.214504
0.2	—	thin_film	—	—	2007	T1	cond-mat/0701376
—	—	thin_film	resistivity	—	2009	T1	0902.2732
—	ambient	thin_film	resistivity	—	2008	T1	0810.2321