Tc max
1.1 K
Tc ambient
1.1 K
arXiv year
2014
Papers
2
Tc exp.
1.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1408.3673, confirmed by 2 papers
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.1 | — | thin_film | resistivity | — | 2014 | T1 | 1408.3673 |
| 0.8 | — | thin_film | — | — | 2018 | T1 | 1810.12801 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire